采用IBM 32nm SOI CMOS技术的谐振体晶体管

R. Marathe, W. Wang, Z. Mahmood, L. Daniel, D. Weinstein
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引用次数: 1

摘要

这项工作提出了一种未发布的cmos集成MEMS谐振器,该谐振器是在IBM 32SOI技术的晶体管级制造的,无需任何后处理或封装即可实现。这些谐振体晶体管(rbt)是电容驱动和使用n沟道场效应晶体管(nFET)压阻感测的。声学布拉格反射器(abr)用于定位完全埋在CMOS堆叠中并被低k介电介质包围的谐振器中的声学振动。第一代混合CMOS-MEMS的实验结果表明,rbt工作在11.1-11.5 GHz,占空比<;5μm × 3μm。有源谐振器的响应显示出与无源谐振器的对比,没有明显的峰值。比较了不同设计条件下器件的性能,证明了abr对杂散模式抑制的影响。实验验证了CMOS堆叠中互补材料的温度稳定性和TCF补偿。
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Resonant Body Transistors in IBM's 32nm SOI CMOS technology
This work presents an unreleased CMOS-integrated MEMS resonators fabricated at the transistor level of IBM's 32SOI technology and realized without the need for any post-processing or packaging. These Resonant Body Transistors (RBTs) are driven capacitively and sensed piezoresistively using an n-channel Field Effect Transistor (nFET). Acoustic Bragg Reflectors (ABRs) are used to localize acoustic vibrations in these resonators completely buried in the CMOS stack and surrounded by low-k dielectric. Experimental results from the first generation hybrid CMOS-MEMS show RBTs operating at 11.1-11.5 GHz with footprints <; 5μm × 3μm. The response of active resonators is shown to contrast with passive resonators showing no discernible peak. Comparative behavior of devices with design variations is used to demonstrate the effect of ABRs on spurious mode suppression. Temperature stability and TCF compensation due to complimentary materials in the CMOS stack are experimentally verified.
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