{"title":"一种用于0.4 ~ 1.6 μ m检测的新型高速宽波长InAlAs/InGaAs肖特基势垒光电二极管","authors":"K. C. Hwang, S.S. Li, Y. Kao","doi":"10.1109/ICIPRM.1990.203051","DOIUrl":null,"url":null,"abstract":"A high-speed, broadband InAlAs/InGaAs graded superlattice Schottky barrier photodiode with useful spectral response extending from 0.4 to 1.6 mu m is demonstrated. The top, wide-bandgap n-In/sub 0.52/Al/sub 0.48/As epilayer absorbs photons in the visible to near-infrared, with peak response occurring around 0.8 mu m; the bottom n-In/sub 0.53/Ga/sub 0.47/As epilayer absorbs photons in the 1.0 to 1.6 mu m wavelength regime, with peak response occurring at 1.3 mu m. The photodiode has a responsivity of 0.34 A/W at 0.8 mu m and 0.42 A/W at 1.3 mu m. Excellent dark I-V characteristics with a reverse leakage current of <1.2 nA and junction capacitance of <0.1 pF at -5 V have been achieved.<<ETX>>","PeriodicalId":138960,"journal":{"name":"International Conference on Indium Phosphide and Related Materials","volume":"153 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A novel high-speed broad wavelength InAlAs/InGaAs Schottky barrier photodiode for 0.4 to 1.6 mu m detection\",\"authors\":\"K. C. Hwang, S.S. Li, Y. Kao\",\"doi\":\"10.1109/ICIPRM.1990.203051\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A high-speed, broadband InAlAs/InGaAs graded superlattice Schottky barrier photodiode with useful spectral response extending from 0.4 to 1.6 mu m is demonstrated. The top, wide-bandgap n-In/sub 0.52/Al/sub 0.48/As epilayer absorbs photons in the visible to near-infrared, with peak response occurring around 0.8 mu m; the bottom n-In/sub 0.53/Ga/sub 0.47/As epilayer absorbs photons in the 1.0 to 1.6 mu m wavelength regime, with peak response occurring at 1.3 mu m. The photodiode has a responsivity of 0.34 A/W at 0.8 mu m and 0.42 A/W at 1.3 mu m. Excellent dark I-V characteristics with a reverse leakage current of <1.2 nA and junction capacitance of <0.1 pF at -5 V have been achieved.<<ETX>>\",\"PeriodicalId\":138960,\"journal\":{\"name\":\"International Conference on Indium Phosphide and Related Materials\",\"volume\":\"153 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Indium Phosphide and Related Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIPRM.1990.203051\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Indium Phosphide and Related Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1990.203051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel high-speed broad wavelength InAlAs/InGaAs Schottky barrier photodiode for 0.4 to 1.6 mu m detection
A high-speed, broadband InAlAs/InGaAs graded superlattice Schottky barrier photodiode with useful spectral response extending from 0.4 to 1.6 mu m is demonstrated. The top, wide-bandgap n-In/sub 0.52/Al/sub 0.48/As epilayer absorbs photons in the visible to near-infrared, with peak response occurring around 0.8 mu m; the bottom n-In/sub 0.53/Ga/sub 0.47/As epilayer absorbs photons in the 1.0 to 1.6 mu m wavelength regime, with peak response occurring at 1.3 mu m. The photodiode has a responsivity of 0.34 A/W at 0.8 mu m and 0.42 A/W at 1.3 mu m. Excellent dark I-V characteristics with a reverse leakage current of <1.2 nA and junction capacitance of <0.1 pF at -5 V have been achieved.<>