{"title":"2-GS/s 6位闪光ADC,带偏移校准","authors":"Ying-Zu Lin, Cheng-Wu Lin, Soon-Jyh Chang","doi":"10.1109/ASSCC.2008.4708808","DOIUrl":null,"url":null,"abstract":"A 6-bit flash analog-to-digital converter (ADC) with a digital offset calibration scheme is fabricated in a 0.13-mum CMOS process. Adjusting the programmable loading devices of the preamplifiers enhances the linearity of the proposed ADC. To reduce power consumption, the utilized current-mode flip-flops change their operation mode depending on the sampling rate. A simple detector composed of an inverter and a diode-connected transistor senses the clock rate. This ADC consumes 170 mW from a 1.2-V supply in high-speed mode. The maximum operation speed of this ADC achieves 3.4 GS/s when the input frequency is low. When operating at 2 GS/s, its ENOB is 5.11 bit and ERBW is 650 MHz. The proposed ADC achieves an FOM of 3.79 pJ/conversion-step at 2 GS/s.","PeriodicalId":143173,"journal":{"name":"2008 IEEE Asian Solid-State Circuits Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"A 2-GS/s 6-bit flash ADC with offset calibration\",\"authors\":\"Ying-Zu Lin, Cheng-Wu Lin, Soon-Jyh Chang\",\"doi\":\"10.1109/ASSCC.2008.4708808\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 6-bit flash analog-to-digital converter (ADC) with a digital offset calibration scheme is fabricated in a 0.13-mum CMOS process. Adjusting the programmable loading devices of the preamplifiers enhances the linearity of the proposed ADC. To reduce power consumption, the utilized current-mode flip-flops change their operation mode depending on the sampling rate. A simple detector composed of an inverter and a diode-connected transistor senses the clock rate. This ADC consumes 170 mW from a 1.2-V supply in high-speed mode. The maximum operation speed of this ADC achieves 3.4 GS/s when the input frequency is low. When operating at 2 GS/s, its ENOB is 5.11 bit and ERBW is 650 MHz. The proposed ADC achieves an FOM of 3.79 pJ/conversion-step at 2 GS/s.\",\"PeriodicalId\":143173,\"journal\":{\"name\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2008.4708808\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2008.4708808","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 6-bit flash analog-to-digital converter (ADC) with a digital offset calibration scheme is fabricated in a 0.13-mum CMOS process. Adjusting the programmable loading devices of the preamplifiers enhances the linearity of the proposed ADC. To reduce power consumption, the utilized current-mode flip-flops change their operation mode depending on the sampling rate. A simple detector composed of an inverter and a diode-connected transistor senses the clock rate. This ADC consumes 170 mW from a 1.2-V supply in high-speed mode. The maximum operation speed of this ADC achieves 3.4 GS/s when the input frequency is low. When operating at 2 GS/s, its ENOB is 5.11 bit and ERBW is 650 MHz. The proposed ADC achieves an FOM of 3.79 pJ/conversion-step at 2 GS/s.