J. Cruz-Colon, V. Narayanan, W. Vonbergen, R. G. Roybal, R. Baumann
{"title":"CDCLVP111-SP低压1:10 LVPECL时钟分配器的辐射评价","authors":"J. Cruz-Colon, V. Narayanan, W. Vonbergen, R. G. Roybal, R. Baumann","doi":"10.1109/NSREC.2017.8115461","DOIUrl":null,"url":null,"abstract":"Single Events Effect (SEE) characterization results for LVPECL 1:10 Clock Distributor is summarized, showing very robust SEE performance up to LET<inf>eff</inf>=69.2 MeV-cm<sup>2</sup>/mg.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiation evaluation of the CDCLVP111-SP low voltage 1:10 LVPECL clock distributor\",\"authors\":\"J. Cruz-Colon, V. Narayanan, W. Vonbergen, R. G. Roybal, R. Baumann\",\"doi\":\"10.1109/NSREC.2017.8115461\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single Events Effect (SEE) characterization results for LVPECL 1:10 Clock Distributor is summarized, showing very robust SEE performance up to LET<inf>eff</inf>=69.2 MeV-cm<sup>2</sup>/mg.\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115461\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115461","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Radiation evaluation of the CDCLVP111-SP low voltage 1:10 LVPECL clock distributor
Single Events Effect (SEE) characterization results for LVPECL 1:10 Clock Distributor is summarized, showing very robust SEE performance up to LETeff=69.2 MeV-cm2/mg.