{"title":"时序电路行为描述的VHDL建模与测试","authors":"V. Pla, J. Santucci, N. Giambiasi","doi":"10.1109/EURDAC.1993.410674","DOIUrl":null,"url":null,"abstract":"A new automatic test generation principle based on a formal modeling of VHDL behavioral descriptions is proposed. Using to the finite state machine representation and a formalism close to that of Petri nets, the authors define two models which represent all the concepts associated with a VHDL description. They then propose a generation principle which uses both forward and backward time processing.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"169 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"On the modeling and testing of VHDL behavioral descriptions of sequential circuits\",\"authors\":\"V. Pla, J. Santucci, N. Giambiasi\",\"doi\":\"10.1109/EURDAC.1993.410674\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new automatic test generation principle based on a formal modeling of VHDL behavioral descriptions is proposed. Using to the finite state machine representation and a formalism close to that of Petri nets, the authors define two models which represent all the concepts associated with a VHDL description. They then propose a generation principle which uses both forward and backward time processing.<<ETX>>\",\"PeriodicalId\":339176,\"journal\":{\"name\":\"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference\",\"volume\":\"169 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EURDAC.1993.410674\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1993.410674","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the modeling and testing of VHDL behavioral descriptions of sequential circuits
A new automatic test generation principle based on a formal modeling of VHDL behavioral descriptions is proposed. Using to the finite state machine representation and a formalism close to that of Petri nets, the authors define two models which represent all the concepts associated with a VHDL description. They then propose a generation principle which uses both forward and backward time processing.<>