内置自检多阈值NULL约定逻辑异步电路

2020 IEEE 38th VLSI Test Symposium (VTS) Pub Date : 2020-04-01 DOI:10.1109/VTS48691.2020.9107627

Brett Sparkman, S. Smith, J. Di

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引用次数: 3

摘要

虽然存在许多异步电路合成的方法，但适用的测试方法有限。本文提出了一种用于多阈值NULL约定逻辑(MTNCL)异步电路的内置自检(BIST)方法，该方法利用标准的同步工具，在最小化面积开销和测试时间的同时实现了最大的故障覆盖率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits

While a number of methods exist for asynchronous circuit synthesis, there are limited applicable test methodologies. This paper presents a Built-In Self-Test (BIST) method for Multi-Threshold NULL Convention Logic (MTNCL) asynchronous circuits, which utilizes standard synchronous tools, and is automated to achieve maximum fault coverage while minimizing area overhead and test time.

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2020 IEEE 38th VLSI Test Symposium (VTS)

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