Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107606
Abhishek Das, N. Touba
Resistive RAM technology with it’s in memory computation and matrix vector multiplication capabilities has paved the way for efficient hardware implementations of neural networks. The ability to store the training weights and perform a direct matrix vector multiplication with the applied inputs thus producing the outputs directly reduces a lot of memory transfer overhead. But such schemes are prone to various soft errors and hard errors due to immature fabrication processes creating marginal cells, read disturbance errors, etc. Soft errors are of concern in this case since they can potentially cause mi-classification of objects leading to catastrophic consequences for safety critical applications. Since the location of soft errors are not known previously, they can potentially manifest in the field leading to data corruption. In this paper, a new on-line error correcting scheme is proposed based on partial and selective checksums which can correct errors in the field. The proposed scheme can correct any number of errors in a single column of a given RRAM matrix. Two different checksum computation schemes are proposed, a majority voting-based scheme and a Hamming code-based scheme. The memory overhead and decoding area, latency and dynamic power consumption for both the proposed schemes are presented. It is seen that the proposed solutions can achieve low decoding latency and comparatively smaller memory and area overhead in order to guarantee protection against errors in a single column. Lastly, a scheme to extend the proposed scheme to multiple column errors is also discussed.
{"title":"Selective Checksum based On-line Error Correction for RRAM based Matrix Operations","authors":"Abhishek Das, N. Touba","doi":"10.1109/VTS48691.2020.9107606","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107606","url":null,"abstract":"Resistive RAM technology with it’s in memory computation and matrix vector multiplication capabilities has paved the way for efficient hardware implementations of neural networks. The ability to store the training weights and perform a direct matrix vector multiplication with the applied inputs thus producing the outputs directly reduces a lot of memory transfer overhead. But such schemes are prone to various soft errors and hard errors due to immature fabrication processes creating marginal cells, read disturbance errors, etc. Soft errors are of concern in this case since they can potentially cause mi-classification of objects leading to catastrophic consequences for safety critical applications. Since the location of soft errors are not known previously, they can potentially manifest in the field leading to data corruption. In this paper, a new on-line error correcting scheme is proposed based on partial and selective checksums which can correct errors in the field. The proposed scheme can correct any number of errors in a single column of a given RRAM matrix. Two different checksum computation schemes are proposed, a majority voting-based scheme and a Hamming code-based scheme. The memory overhead and decoding area, latency and dynamic power consumption for both the proposed schemes are presented. It is seen that the proposed solutions can achieve low decoding latency and comparatively smaller memory and area overhead in order to guarantee protection against errors in a single column. Lastly, a scheme to extend the proposed scheme to multiple column errors is also discussed.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122539547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107610
Koji Asami, Keisuke Kusunoki, N. Shimizu, Yoshiyuki Aoki
Recently, bandwidth for wireless communications are getting wider, i.e. 400 MHz for the 5th generation mobile communication (5G), and about 2 GHz for wireless LAN (IEEE 802.11ad). To evaluate the transceiver devices used in these communications, a high-speed waveform digitizer is required. In this paper, the "Local Sweep Digitizing Method" which accurately captures ultra-wideband signals covering 2 GHz with low cost is introduced. It is a method of decomposing a wideband signal transmitted at a high frequency into subband signals of several hundred megahertz bandwidths while downconverting it to an intermediate frequency, and capturing it for each subband signal by a low speed waveform digitizer. The captured waveform is synthesized by post digital processing. At this time, a correction process for matching the carrier phase and the conversion gain of each subband signal is performed. In this method, an ultra-wideband signal can be captured by a single low-speed high-resolution analog-to-digital converter (ADC) and the measurable bandwidth can be easily controlled by adjusting the Local Sweep section.
{"title":"Ultra-Wideband Modulation Signal Measurement Using Local Sweep Digitizing Method","authors":"Koji Asami, Keisuke Kusunoki, N. Shimizu, Yoshiyuki Aoki","doi":"10.1109/VTS48691.2020.9107610","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107610","url":null,"abstract":"Recently, bandwidth for wireless communications are getting wider, i.e. 400 MHz for the 5th generation mobile communication (5G), and about 2 GHz for wireless LAN (IEEE 802.11ad). To evaluate the transceiver devices used in these communications, a high-speed waveform digitizer is required. In this paper, the \"Local Sweep Digitizing Method\" which accurately captures ultra-wideband signals covering 2 GHz with low cost is introduced. It is a method of decomposing a wideband signal transmitted at a high frequency into subband signals of several hundred megahertz bandwidths while downconverting it to an intermediate frequency, and capturing it for each subband signal by a low speed waveform digitizer. The captured waveform is synthesized by post digital processing. At this time, a correction process for matching the carrier phase and the conversion gain of each subband signal is performed. In this method, an ultra-wideband signal can be captured by a single low-speed high-resolution analog-to-digital converter (ADC) and the measurable bandwidth can be easily controlled by adjusting the Local Sweep section.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115922847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/vts48691.2020.9107596
{"title":"VTS 2020 Steering and Program Committees","authors":"","doi":"10.1109/vts48691.2020.9107596","DOIUrl":"https://doi.org/10.1109/vts48691.2020.9107596","url":null,"abstract":"","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121958078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107636
Marc Hutner, R. Sethuram, B. Vinnakota, Dave Armstrong, A. Copperhall
Chiplet-based designs enable the heterogeneous integration of die from multiple process nodes into a single packaged product. High-bandwidth memory is a well-known high-volume chiplet-based product. Today, most chiplet-based logic products are single-vendor products built with proprietary die-to-die (D2D) interfaces between the chiplets in a package. Industry and academia have developed standards and methods to address the test challenges expected with chiplet-based products. These efforts have focused on improving die yield and test access structures. The Open Compute Project’s Open Domain-Specific Architecture (ODSA) is a new effort that aims to define an open physical and logical D2D interface and create a marketplace of chiplets. With an open interface, product developers can integrate best in class chiplets from multiple vendors. An open D2D interface offers both new opportunities and challenges in testing multi-chiplet products. The opportunity is in leveraging economies of scale. The challenge is in enabling greater interoperability between test structures in different chiplets and across vendors. This paper reviews recent developments in chiplet test, especially leveraging work on HBM and discusses their extension to testing products based on open D2D interfaces.
{"title":"Special Session: Test Challenges in a Chiplet Marketplace","authors":"Marc Hutner, R. Sethuram, B. Vinnakota, Dave Armstrong, A. Copperhall","doi":"10.1109/VTS48691.2020.9107636","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107636","url":null,"abstract":"Chiplet-based designs enable the heterogeneous integration of die from multiple process nodes into a single packaged product. High-bandwidth memory is a well-known high-volume chiplet-based product. Today, most chiplet-based logic products are single-vendor products built with proprietary die-to-die (D2D) interfaces between the chiplets in a package. Industry and academia have developed standards and methods to address the test challenges expected with chiplet-based products. These efforts have focused on improving die yield and test access structures. The Open Compute Project’s Open Domain-Specific Architecture (ODSA) is a new effort that aims to define an open physical and logical D2D interface and create a marketplace of chiplets. With an open interface, product developers can integrate best in class chiplets from multiple vendors. An open D2D interface offers both new opportunities and challenges in testing multi-chiplet products. The opportunity is in leveraging economies of scale. The challenge is in enabling greater interoperability between test structures in different chiplets and across vendors. This paper reviews recent developments in chiplet test, especially leveraging work on HBM and discusses their extension to testing products based on open D2D interfaces.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129919281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107622
Adam Duncan, Adib Nahiyan, Fahim Rahman, Grant Skipper, D. M. Swany, Andrew Lukefahr, Farimah Farahmandi, M. Tehranipoor
The bitstream inside a Field-Programmable Gate Array (FPGA) is often protected using an encryption key, acting as a root of trust and stored inside the FPGA, to defend against bitstream piracy, tampering, overproduction, and static-time reverse engineering. For cost savings and faster production, trusted system designers often rely on an untrusted system assembler to program the encryption key into the FPGA, focusing only the end-user-stage threats. However, providing the secret encryption key to an untrusted entity introduces additional threats, since access to this key can compromise the entire root of trust and breach the encrypted bitstream enabling a multitude of attacks including Trojan insertion, piracy and overproduction. To address this issue, we propose the Secure Remote FPGA Initialization (SeRFI) protocol to transmit the encryption key securely from a trusted system designer into an FPGA in physical possession of an untrusted system assembler. Our protocol eliminates direct key sharing with the untrusted system assembler as well as prevents against adversarial intention of extracting the encryption key during the programming phase where the assembler has physical access to the FPGA.
{"title":"SeRFI: Secure Remote FPGA Initialization in an Untrusted Environment","authors":"Adam Duncan, Adib Nahiyan, Fahim Rahman, Grant Skipper, D. M. Swany, Andrew Lukefahr, Farimah Farahmandi, M. Tehranipoor","doi":"10.1109/VTS48691.2020.9107622","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107622","url":null,"abstract":"The bitstream inside a Field-Programmable Gate Array (FPGA) is often protected using an encryption key, acting as a root of trust and stored inside the FPGA, to defend against bitstream piracy, tampering, overproduction, and static-time reverse engineering. For cost savings and faster production, trusted system designers often rely on an untrusted system assembler to program the encryption key into the FPGA, focusing only the end-user-stage threats. However, providing the secret encryption key to an untrusted entity introduces additional threats, since access to this key can compromise the entire root of trust and breach the encrypted bitstream enabling a multitude of attacks including Trojan insertion, piracy and overproduction. To address this issue, we propose the Secure Remote FPGA Initialization (SeRFI) protocol to transmit the encryption key securely from a trusted system designer into an FPGA in physical possession of an untrusted system assembler. Our protocol eliminates direct key sharing with the untrusted system assembler as well as prevents against adversarial intention of extracting the encryption key during the programming phase where the assembler has physical access to the FPGA.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130474091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107603
Soumya Mittal, R. D. Blanton
Software diagnosis is the process of locating and characterizing a defect in a failing chip. It is the cornerstone of failure analysis that consequently enables yield learning and monitoring. However, multiple-defect diagnosis is challenging due to error masking and unmasking effects, and exponential complexity of the solution search process. This paper describes a three-phase, physically-aware diagnosis methodology called MDLearnX to effectively diagnose multiple defects, and in turn, aid in accelerating the design and process development. The first phase identifies a defect that resembles traditional fault models. The second and the third phases utilize the X-fault model and machine learning to identify correct candidates. Results from a thorough fault injection and simulation experiment demonstrate that MD-LearnX returns an ideal diagnosis 2X more often than commercial diagnosis. Its effectiveness is further evidenced through a silicon experiment, where, on average, MD-LearnX returns 5.3 fewer candidates per diagnosis as compared to state-of-the-art commercial diagnosis without losing accuracy.
{"title":"A Deterministic-Statistical Multiple-Defect Diagnosis Methodology","authors":"Soumya Mittal, R. D. Blanton","doi":"10.1109/VTS48691.2020.9107603","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107603","url":null,"abstract":"Software diagnosis is the process of locating and characterizing a defect in a failing chip. It is the cornerstone of failure analysis that consequently enables yield learning and monitoring. However, multiple-defect diagnosis is challenging due to error masking and unmasking effects, and exponential complexity of the solution search process. This paper describes a three-phase, physically-aware diagnosis methodology called MDLearnX to effectively diagnose multiple defects, and in turn, aid in accelerating the design and process development. The first phase identifies a defect that resembles traditional fault models. The second and the third phases utilize the X-fault model and machine learning to identify correct candidates. Results from a thorough fault injection and simulation experiment demonstrate that MD-LearnX returns an ideal diagnosis 2X more often than commercial diagnosis. Its effectiveness is further evidenced through a silicon experiment, where, on average, MD-LearnX returns 5.3 fewer candidates per diagnosis as compared to state-of-the-art commercial diagnosis without losing accuracy.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114562130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107642
E. Schneider, H. Wunderlich
Design and test validation of systems with adaptive voltage-and frequency scaling (AVFS) requires timing simulation with accurate timing models under multiple operating points. Such models are usually located at logic level and compromise accuracy and simulation speed due to the runtime complexity.This paper presents the first massively parallel time simulator at switch level that uses parametric delay modeling for efficient timing-accurate validation of systems with AVFS. It provides full glitch-accurate switching activity information of designs under varying supply voltage and temperature. Offline statistical learning with regression analysis is employed to generate polynomials for dynamic delay modeling by approximation of the first-order electrical parameters of CMOS standard cells. With the parallelization on graphics processing units and simultaneous exploitation of multiple dimensions of parallelism the simulation throughput is maximized and scalable-design space exploration of AVFS-based systems is enabled. Results demonstrate the accuracy and efficiency with speedups of up to 159× over conventional logic level time simulation with static delays.
{"title":"Switch Level Time Simulation of CMOS Circuits with Adaptive Voltage and Frequency Scaling","authors":"E. Schneider, H. Wunderlich","doi":"10.1109/VTS48691.2020.9107642","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107642","url":null,"abstract":"Design and test validation of systems with adaptive voltage-and frequency scaling (AVFS) requires timing simulation with accurate timing models under multiple operating points. Such models are usually located at logic level and compromise accuracy and simulation speed due to the runtime complexity.This paper presents the first massively parallel time simulator at switch level that uses parametric delay modeling for efficient timing-accurate validation of systems with AVFS. It provides full glitch-accurate switching activity information of designs under varying supply voltage and temperature. Offline statistical learning with regression analysis is employed to generate polynomials for dynamic delay modeling by approximation of the first-order electrical parameters of CMOS standard cells. With the parallelization on graphics processing units and simultaneous exploitation of multiple dimensions of parallelism the simulation throughput is maximized and scalable-design space exploration of AVFS-based systems is enabled. Results demonstrate the accuracy and efficiency with speedups of up to 159× over conventional logic level time simulation with static delays.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116946946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1109/VTS48691.2020.9107612
Katayoon Basharkhah, Rezgar Sadeghi, Nooshin Nosrati, Z. Navabi
At the system-level, cores are put together using interconnects that we refer to as high-level communication links. This paper presents an abstract interconnect model for cores connecting to each other to estimate, and thus model, crosstalk noise resulting from the physical properties of interconnects. Such models consider the effects of adjacent wires on each other in the form of weighted transitions. Transition weights are extracted by DC analysis of interconnect SPICE models. These weights form our raw-models, which are then specialized by AC analysis of RLC interconnect models in a mixed-signal simulation environment. The latter analyses establish weight thresholds for glitch faults. Our simulations show that if we were to use only DC-based models for crosstalk faults, we would be over / under-estimating faults as compared with models that are specialized by AC simulation runs. For higher data rates, Specialized models perform an order of magnitude better than DC-based models for crosstalk fault detection.
{"title":"ESL, Back-annotating Crosstalk Fault Models into High-level Communication Links","authors":"Katayoon Basharkhah, Rezgar Sadeghi, Nooshin Nosrati, Z. Navabi","doi":"10.1109/VTS48691.2020.9107612","DOIUrl":"https://doi.org/10.1109/VTS48691.2020.9107612","url":null,"abstract":"At the system-level, cores are put together using interconnects that we refer to as high-level communication links. This paper presents an abstract interconnect model for cores connecting to each other to estimate, and thus model, crosstalk noise resulting from the physical properties of interconnects. Such models consider the effects of adjacent wires on each other in the form of weighted transitions. Transition weights are extracted by DC analysis of interconnect SPICE models. These weights form our raw-models, which are then specialized by AC analysis of RLC interconnect models in a mixed-signal simulation environment. The latter analyses establish weight thresholds for glitch faults. Our simulations show that if we were to use only DC-based models for crosstalk faults, we would be over / under-estimating faults as compared with models that are specialized by AC simulation runs. For higher data rates, Specialized models perform an order of magnitude better than DC-based models for crosstalk fault detection.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128440835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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