分子QCA可逆1D阵列的测试

Xiaojun Ma, Jing Huang, C. Metra, F. Lombardi
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引用次数: 38

摘要

可逆逻辑设计是数字计算中一个众所周知的范例。虽然有大量的文献存在于其数学表征上,但很少有关于其可能的技术基础的报道。本文研究了一种量子点元胞自动机(QCA),用于可逆逻辑的可测试实现。提出了两个新的可逆门(记作QCA1和QCA2)。这些门(在延迟,面积和逻辑合成方面)与QCA实现的其他可逆门(如Toffoli和Fredkin)进行比较。由于可逆性的双射性质使得测试比一般情况下容易得多,因此对可逆门进行了详细的测试。研究了一维阵列在单单元故障和多单元故障情况下的c -可测性。在单个缺失/附加单元假设下,对可逆门进行缺陷分析
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Testing Reversible 1D Arrays for Molecular QCA
Reversible logic design is a well-known paradigm in digital computation. While an extensive literature exists on its mathematical characterization, little work has been reported on its possible technological basis. In this paper, a quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic. Two new reversible gates (denoted as QCA1 and QCA2) are proposed. These gates are compared (in terms of delay, area and logic synthesis) with other reversible gates (such as Toffoli and Fredkin) for QCA implementation. As the bijective nature of reversibility makes testing significantly easier than in the general case, testing of the reversible gates is pursued in detail. C-testability of a 1D array is investigated for single cell fault as well multiple cell faults. Defect analysis of the reversible gates is pursued under a single missing/additional cell assumption
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