{"title":"一个2 ns 16 K ECL RAM,降低了字线电压波动","authors":"Y. Nakase, T. Ikeda, K. Mashiko, S. Kayano","doi":"10.1109/VLSIC.1990.111088","DOIUrl":null,"url":null,"abstract":"A reduced word line voltage swing circuit is proposed in order to achieve high-speed ECL (emitter coupled logic) RAMs. This makes the word line voltage swing small without any sacrifice of the write operation, and allows 25% faster read operation to be obtained. In the circuit, large ISR and small reverse mode current gain are required for the fast write operation","PeriodicalId":239990,"journal":{"name":"Digest of Technical Papers., 1990 Symposium on VLSI Circuits","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A 2 ns 16 K ECL RAM with reduced word line voltage swing\",\"authors\":\"Y. Nakase, T. Ikeda, K. Mashiko, S. Kayano\",\"doi\":\"10.1109/VLSIC.1990.111088\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A reduced word line voltage swing circuit is proposed in order to achieve high-speed ECL (emitter coupled logic) RAMs. This makes the word line voltage swing small without any sacrifice of the write operation, and allows 25% faster read operation to be obtained. In the circuit, large ISR and small reverse mode current gain are required for the fast write operation\",\"PeriodicalId\":239990,\"journal\":{\"name\":\"Digest of Technical Papers., 1990 Symposium on VLSI Circuits\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Technical Papers., 1990 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.1990.111088\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Technical Papers., 1990 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1990.111088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 2 ns 16 K ECL RAM with reduced word line voltage swing
A reduced word line voltage swing circuit is proposed in order to achieve high-speed ECL (emitter coupled logic) RAMs. This makes the word line voltage swing small without any sacrifice of the write operation, and allows 25% faster read operation to be obtained. In the circuit, large ISR and small reverse mode current gain are required for the fast write operation