氮化镓发光二极管光输出的质子能量依赖性

S. Khanna, D. Estan, L. Erhardt, A. Houdayer, C. Carlone, A. lonascut Nedelcescu, S. Messenger, R. Walters, G.P. Surnmers, J. Warner, I. Jun
{"title":"氮化镓发光二极管光输出的质子能量依赖性","authors":"S. Khanna, D. Estan, L. Erhardt, A. Houdayer, C. Carlone, A. lonascut Nedelcescu, S. Messenger, R. Walters, G.P. Surnmers, J. Warner, I. Jun","doi":"10.1109/TNS.2004.835097","DOIUrl":null,"url":null,"abstract":"Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1/spl times/10/sup 11/ to 1/spl times/10/sup 15/ cm/sup -2/. Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1/E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.","PeriodicalId":329028,"journal":{"name":"Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"Proton energy dependence of the light output in gallium nitride light emitting diodes\",\"authors\":\"S. Khanna, D. Estan, L. Erhardt, A. Houdayer, C. Carlone, A. lonascut Nedelcescu, S. Messenger, R. Walters, G.P. Surnmers, J. Warner, I. Jun\",\"doi\":\"10.1109/TNS.2004.835097\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1/spl times/10/sup 11/ to 1/spl times/10/sup 15/ cm/sup -2/. Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1/E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.\",\"PeriodicalId\":329028,\"journal\":{\"name\":\"Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-10-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TNS.2004.835097\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TNS.2004.835097","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 32

摘要

用能量范围为2 ~ 115 MeV的质子在室温下辐照氮化镓(GaN)基蓝色发光二极管(CREE型号C430-DH85),辐照强度从1/spl倍/10/sup 11/到1/spl倍/10/sup 15/ cm/sup -2/不等。根据Rose和Barnes的理论,得到了每种能量的光输出衰减曲线,并确定了与这些曲线相关的损伤常数(A)。在质子能量小于10 MeV时,A与质子能量(E)成反比,在更高能量时,A始终在1/E以上。能量依赖性质的变化归因于核相互作用。给出了氮化镓上质子的非电离能量损失计算。理论与实验结果吻合较好。
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Proton energy dependence of the light output in gallium nitride light emitting diodes
Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1/spl times/10/sup 11/ to 1/spl times/10/sup 15/ cm/sup -2/. Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1/E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.
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