微电子组件热管理中高取向热解石墨散热片性能的数值分析

T. Tilford, A. Cook, H. Lu, A. Ramambasoa, F. Conseil
{"title":"微电子组件热管理中高取向热解石墨散热片性能的数值分析","authors":"T. Tilford, A. Cook, H. Lu, A. Ramambasoa, F. Conseil","doi":"10.1109/ESTC.2014.6962815","DOIUrl":null,"url":null,"abstract":"An inverse analysis approach combining numerical and experimental analyses has been utilised to determine the in-situ effective material properties of Highly Oriented Pyrolytic Graphite (HOPG) in a microelectronics test assembly. The approach adopted uses a Finite Element analysis package to determine temperature distribution over a thermal test assembly. A Virtual Design of Experiments approach is used to define a series of analyses with discrete thermal material properties which is used in conjunction with a particle swarm optimisation algorithm to form a response surface function relating temperature to material property values at a number of monitoring points. Experimental data is used to form an error metric which is subsequently minimised to determine effective material properties of the HOPG material. Subsequently a series of studies contrasting the performance of the HOPG material with common heat spreader materials were performed. Results show that the effective thermal property values of the HOPG material seem to be greater than suggested in existing literature and that the HOPG material reduces peak assembly temperatures by a significant amount.","PeriodicalId":299981,"journal":{"name":"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Numerical analysis of the performance of highly oriented pyrolytic graphite heat spreader in thermal management of microelectronics assemblies\",\"authors\":\"T. Tilford, A. Cook, H. Lu, A. Ramambasoa, F. Conseil\",\"doi\":\"10.1109/ESTC.2014.6962815\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An inverse analysis approach combining numerical and experimental analyses has been utilised to determine the in-situ effective material properties of Highly Oriented Pyrolytic Graphite (HOPG) in a microelectronics test assembly. The approach adopted uses a Finite Element analysis package to determine temperature distribution over a thermal test assembly. A Virtual Design of Experiments approach is used to define a series of analyses with discrete thermal material properties which is used in conjunction with a particle swarm optimisation algorithm to form a response surface function relating temperature to material property values at a number of monitoring points. Experimental data is used to form an error metric which is subsequently minimised to determine effective material properties of the HOPG material. Subsequently a series of studies contrasting the performance of the HOPG material with common heat spreader materials were performed. Results show that the effective thermal property values of the HOPG material seem to be greater than suggested in existing literature and that the HOPG material reduces peak assembly temperatures by a significant amount.\",\"PeriodicalId\":299981,\"journal\":{\"name\":\"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTC.2014.6962815\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2014.6962815","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

采用数值分析和实验分析相结合的逆分析方法,确定了微电子测试组件中高取向热解石墨(HOPG)的原位有效材料性能。采用的方法是使用有限元分析包来确定热测试组件的温度分布。实验虚拟设计方法用于定义一系列具有离散热材料特性的分析,该分析与粒子群优化算法结合使用,以形成与许多监测点的温度与材料特性值相关的响应面函数。实验数据用于形成误差度量,该度量随后被最小化以确定HOPG材料的有效材料特性。随后进行了一系列研究,对比了HOPG材料与普通散热材料的性能。结果表明,HOPG材料的有效热性能值似乎比现有文献中建议的要大,并且HOPG材料显著降低了峰值组装温度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Numerical analysis of the performance of highly oriented pyrolytic graphite heat spreader in thermal management of microelectronics assemblies
An inverse analysis approach combining numerical and experimental analyses has been utilised to determine the in-situ effective material properties of Highly Oriented Pyrolytic Graphite (HOPG) in a microelectronics test assembly. The approach adopted uses a Finite Element analysis package to determine temperature distribution over a thermal test assembly. A Virtual Design of Experiments approach is used to define a series of analyses with discrete thermal material properties which is used in conjunction with a particle swarm optimisation algorithm to form a response surface function relating temperature to material property values at a number of monitoring points. Experimental data is used to form an error metric which is subsequently minimised to determine effective material properties of the HOPG material. Subsequently a series of studies contrasting the performance of the HOPG material with common heat spreader materials were performed. Results show that the effective thermal property values of the HOPG material seem to be greater than suggested in existing literature and that the HOPG material reduces peak assembly temperatures by a significant amount.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Development of an electro-optical circuit board technology with embedded single-mode glass waveguide layer Influence of soft sensor chip bonds on the formation of wire bond interconnections Integrated printed hybrid electronics on paper Flip-chip bonding processes with low volume SoP technology Reliability performance of Au-Sn and Cu-Sn wafer level SLID bonds for MEMS
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1