{"title":"在厚SOI晶圆上构造的紧凑的200V二极管","authors":"J. Pjencak, Ladislav Seliga","doi":"10.1109/ISPSD57135.2023.10147711","DOIUrl":null,"url":null,"abstract":"In the recent decade, the modern Smart Power Applications drive BCD technologies to higher voltage nodes (>100V), lower cost and isolation improvement. Thick SOI technology is one of the options providing sufficient breakdown and desired power. Doping of device wafer is setup low to support necessary spread of depletion region. Typical HV diode is made by implanting a layer of opposite dopant type. Lateral distance between anode and cathode contacts is then defining diode area and become more significant for higher operating voltage. Our work demonstrates a new approach that enable significantly smaller size without additional cost.","PeriodicalId":344266,"journal":{"name":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Compact 200V Diode Constructed on Thick SOI Wafer\",\"authors\":\"J. Pjencak, Ladislav Seliga\",\"doi\":\"10.1109/ISPSD57135.2023.10147711\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the recent decade, the modern Smart Power Applications drive BCD technologies to higher voltage nodes (>100V), lower cost and isolation improvement. Thick SOI technology is one of the options providing sufficient breakdown and desired power. Doping of device wafer is setup low to support necessary spread of depletion region. Typical HV diode is made by implanting a layer of opposite dopant type. Lateral distance between anode and cathode contacts is then defining diode area and become more significant for higher operating voltage. Our work demonstrates a new approach that enable significantly smaller size without additional cost.\",\"PeriodicalId\":344266,\"journal\":{\"name\":\"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)\",\"volume\":\"124 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD57135.2023.10147711\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD57135.2023.10147711","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In the recent decade, the modern Smart Power Applications drive BCD technologies to higher voltage nodes (>100V), lower cost and isolation improvement. Thick SOI technology is one of the options providing sufficient breakdown and desired power. Doping of device wafer is setup low to support necessary spread of depletion region. Typical HV diode is made by implanting a layer of opposite dopant type. Lateral distance between anode and cathode contacts is then defining diode area and become more significant for higher operating voltage. Our work demonstrates a new approach that enable significantly smaller size without additional cost.