{"title":"特别会议12B:专题讨论:物联网-可靠?安全吗?还是被十亿刀砍死?","authors":"S. Kodakara, S. Natarajan","doi":"10.1109/VTS.2015.7116304","DOIUrl":null,"url":null,"abstract":"The era of Internet-Of-Things, or IOT - ubiquitous connected components, shared across an intelligent communication medium, and analyzed by massive storage and analysis “clouds” - has begun. With development of deep integration and sensor technologies, very high speed network connectivity, and huge server farms that can provide 24×7 service, the ability to monitor, process and optimize our work and personal life is at our door step.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Special session 12B: Panel: IOT - Reliable? Secure? Or death by a billion cuts?\",\"authors\":\"S. Kodakara, S. Natarajan\",\"doi\":\"10.1109/VTS.2015.7116304\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The era of Internet-Of-Things, or IOT - ubiquitous connected components, shared across an intelligent communication medium, and analyzed by massive storage and analysis “clouds” - has begun. With development of deep integration and sensor technologies, very high speed network connectivity, and huge server farms that can provide 24×7 service, the ability to monitor, process and optimize our work and personal life is at our door step.\",\"PeriodicalId\":187545,\"journal\":{\"name\":\"2015 IEEE 33rd VLSI Test Symposium (VTS)\",\"volume\":\"143 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 33rd VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2015.7116304\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 33rd VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2015.7116304","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Special session 12B: Panel: IOT - Reliable? Secure? Or death by a billion cuts?
The era of Internet-Of-Things, or IOT - ubiquitous connected components, shared across an intelligent communication medium, and analyzed by massive storage and analysis “clouds” - has begun. With development of deep integration and sensor technologies, very high speed network connectivity, and huge server farms that can provide 24×7 service, the ability to monitor, process and optimize our work and personal life is at our door step.
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