超薄体超薄BOX器件中的自热和衬底效应

S. Makovejev, V. Kilchytska, M. Arshad, D. Flandre, F. Andrieu, O. Faynot, S. Olsen, J. Raskin
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引用次数: 13

摘要

讨论并定性比较了无接地超薄体超薄BOX (UTB2)器件的自热效应和衬底效应。超薄的机身由于界面效应而使器件的热性能恶化。超薄BOX (10nm)改善了从通道到大块硅衬底的散热,但也导致了强烈的衬底效应。可以观察到,由于衬底效应导致的UTB2器件的输出电导退化与由于自加热引起的退化一样强。
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Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices
Self-heating and substrate effects are discussed and qualitatively compared in the ultra-thin body ultra-thin BOX (UTB2) devices without a ground plane. Ultra-thin body is aggravating thermal properties of the devices due to the interface effects. Ultra-thin BOX (10 nm) improves heat dissipation from the channel to the bulk silicon substrate but also results in strongly pronounced substrate effects. It is observed that output conductance degradation in the UTB2 devices due to the substrate effects can be as strong as degradation due to the self-heating.
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