重离子和质子诱导的单事件效应对Microchip RT PolarFire FPGA的影响

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI:10.1109/RADECS50773.2020.9857704

N. Rezzak, J.J. Wang, R. Chipana, C. Lao, G. Bakker, F. Hawley, E. Hamdy

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引用次数: 1

摘要

利用重离子和64 MeV质子对Microchip 28 nm RT极化火sonos FPGA的单事件响应进行了表征。由于SONOS技术和RT PolarFire FPGA的配置单元设计，SONOS配置单元具有SEU免疫功能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Heavy Ion and Proton Induced Single Event Effects on Microchip RT PolarFire FPGA

The Single-Event response of Microchip 28 nm RT PolarFire SONOS-based FPGA is characterized using heavy ion and 64 MeV proton. The SONOS configuration cell is SEU immune due to the SONOS technology and the design of the configuration cell of RT PolarFire FPGA.

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来源期刊

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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