S. C. Witczak, Jeremiah J. Horner, James Hack, N.P. Goldstein, Paul Dudek, Brainton Song, S. Messenger, Glen E. Macejik, Thomas J. Knight
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Compendium of Single Event Effects Test Results for Selected Integrated Circuits
Test results for single event effects due to heavy-ion irradiation are reported for more than 30 part types. Event characterization includes LET thresholds, cross-sections and os-cilloscope captures for both destructive and non-destructive events. Event rates for selected parts are estimated from the cross-section data for three orbits. These results will provide systems designers information that is critical to parts selection for space applications.
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