在高速I/O上对供应噪声的信号灵敏度

S. R. Chan, F. Tan, R. Mohd-Mokhtar
{"title":"在高速I/O上对供应噪声的信号灵敏度","authors":"S. R. Chan, F. Tan, R. Mohd-Mokhtar","doi":"10.1109/IEMT.2012.6521813","DOIUrl":null,"url":null,"abstract":"Power Distribution Network (PDN) is optimized based on conventional AC and DC noise target specification. Large supply noise occurs due to increase in speed and number of I/O running simultaneously. In this paper, an alternate means to quantify supply noise to signal performance is discussed. Discussion focuses on signal performance impact caused by supply noise with different frequency content. Simulation is carried out using transistor model and findings are then correlated through lab measurements. Using USB I/O as a test case, findings conclude that the USB transmitter performance is less sensitive to supply noise at circuit operating frequency (480 MHz) and its harmonic. Hence, excessive AC noise at its less sensitive region will not cause signal eye diagram to fail.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"548 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Signal sensitivity to supply noise on high-speed I/O\",\"authors\":\"S. R. Chan, F. Tan, R. Mohd-Mokhtar\",\"doi\":\"10.1109/IEMT.2012.6521813\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power Distribution Network (PDN) is optimized based on conventional AC and DC noise target specification. Large supply noise occurs due to increase in speed and number of I/O running simultaneously. In this paper, an alternate means to quantify supply noise to signal performance is discussed. Discussion focuses on signal performance impact caused by supply noise with different frequency content. Simulation is carried out using transistor model and findings are then correlated through lab measurements. Using USB I/O as a test case, findings conclude that the USB transmitter performance is less sensitive to supply noise at circuit operating frequency (480 MHz) and its harmonic. Hence, excessive AC noise at its less sensitive region will not cause signal eye diagram to fail.\",\"PeriodicalId\":315408,\"journal\":{\"name\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"volume\":\"548 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2012.6521813\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

配电网(PDN)是根据传统的交直流噪声指标进行优化的。由于同时运行I/O的速度和数量的增加,会产生较大的电源噪声。本文讨论了一种量化电源噪声对信号性能影响的替代方法。重点讨论了不同频率含量的电源噪声对信号性能的影响。使用晶体管模型进行仿真,然后通过实验室测量将结果相关联。使用USB I/O作为测试案例,研究结果表明USB发射机性能对电路工作频率(480 MHz)下的电源噪声及其谐波不太敏感。因此,在其较不敏感的区域过多的交流噪声不会导致信号眼图失效。
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Signal sensitivity to supply noise on high-speed I/O
Power Distribution Network (PDN) is optimized based on conventional AC and DC noise target specification. Large supply noise occurs due to increase in speed and number of I/O running simultaneously. In this paper, an alternate means to quantify supply noise to signal performance is discussed. Discussion focuses on signal performance impact caused by supply noise with different frequency content. Simulation is carried out using transistor model and findings are then correlated through lab measurements. Using USB I/O as a test case, findings conclude that the USB transmitter performance is less sensitive to supply noise at circuit operating frequency (480 MHz) and its harmonic. Hence, excessive AC noise at its less sensitive region will not cause signal eye diagram to fail.
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