固液互扩散键合的高温剪切强度:Cu-Sn, Au-Sn和Au-In

K. Aasmundtveit, T. Luu, Astrid-Sofie B. Vardøy, T. A. Tollefsen, Kaiying Wang, N. Hoivik
{"title":"固液互扩散键合的高温剪切强度:Cu-Sn, Au-Sn和Au-In","authors":"K. Aasmundtveit, T. Luu, Astrid-Sofie B. Vardøy, T. A. Tollefsen, Kaiying Wang, N. Hoivik","doi":"10.1109/ESTC.2014.6962772","DOIUrl":null,"url":null,"abstract":"Solid-Liquid Interdiffusion (SLID) bonding is a promising bonding technique, particularly for high-temperature applications. Based on intermetallics as the bonding medium, the bonds are stable at temperatures far above the processing temperature which is in the range of normal solder temperatures. This work confirms experimentally this high-temperature stability through shear strength testing as function of temperature (room temperature to 300 °C) for three different SLID systems: Cu-Sn, Au-Sn and Au-In. All three systems remain solid within the tested temperature range, as expected, but they show remarkably different temperature dependence of mechanical strength: Au-Sn SLID bonds show strongly decreasing shear strength with temperature (but at 300 °C it is still well above the MIL-STD requirement); Cu-Sn SLID bonds show only small changes; whereas Au-In SLID bonds show increased shear strength at 300 °C, accompanied with a change in fracture mode from brittle to ductile. All three behaviours can be explained from the phase diagrams with the actual phases in use.","PeriodicalId":299981,"journal":{"name":"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)","volume":"420 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"High-temperature shear strength of solid-liquid interdiffusion (SLID) bonding: Cu-Sn, Au-Sn and Au-In\",\"authors\":\"K. Aasmundtveit, T. Luu, Astrid-Sofie B. Vardøy, T. A. Tollefsen, Kaiying Wang, N. Hoivik\",\"doi\":\"10.1109/ESTC.2014.6962772\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Solid-Liquid Interdiffusion (SLID) bonding is a promising bonding technique, particularly for high-temperature applications. Based on intermetallics as the bonding medium, the bonds are stable at temperatures far above the processing temperature which is in the range of normal solder temperatures. This work confirms experimentally this high-temperature stability through shear strength testing as function of temperature (room temperature to 300 °C) for three different SLID systems: Cu-Sn, Au-Sn and Au-In. All three systems remain solid within the tested temperature range, as expected, but they show remarkably different temperature dependence of mechanical strength: Au-Sn SLID bonds show strongly decreasing shear strength with temperature (but at 300 °C it is still well above the MIL-STD requirement); Cu-Sn SLID bonds show only small changes; whereas Au-In SLID bonds show increased shear strength at 300 °C, accompanied with a change in fracture mode from brittle to ductile. All three behaviours can be explained from the phase diagrams with the actual phases in use.\",\"PeriodicalId\":299981,\"journal\":{\"name\":\"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)\",\"volume\":\"420 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTC.2014.6962772\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 5th Electronics System-integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2014.6962772","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

固液互扩散键合是一种很有前途的键合技术,特别是在高温应用中。基于金属间化合物作为键合介质,在远高于正常焊接温度范围内的加工温度下,键合是稳定的。这项工作通过实验证实了三种不同的滑动系统(Cu-Sn, Au-Sn和Au-In)的高温稳定性,通过剪切强度测试作为温度(室温至300°C)的函数。这三种体系在测试温度范围内都保持固体状态,正如预期的那样,但它们表现出明显不同的机械强度温度依赖性:Au-Sn滑动键的剪切强度随着温度的升高而急剧下降(但在300°C时仍远高于MIL-STD要求);Cu-Sn滑动键变化不大;而Au-In滑动键在300°C时抗剪强度增加,同时断裂模式从脆性转变为延性。所有三种行为都可以用实际使用的阶段图来解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
High-temperature shear strength of solid-liquid interdiffusion (SLID) bonding: Cu-Sn, Au-Sn and Au-In
Solid-Liquid Interdiffusion (SLID) bonding is a promising bonding technique, particularly for high-temperature applications. Based on intermetallics as the bonding medium, the bonds are stable at temperatures far above the processing temperature which is in the range of normal solder temperatures. This work confirms experimentally this high-temperature stability through shear strength testing as function of temperature (room temperature to 300 °C) for three different SLID systems: Cu-Sn, Au-Sn and Au-In. All three systems remain solid within the tested temperature range, as expected, but they show remarkably different temperature dependence of mechanical strength: Au-Sn SLID bonds show strongly decreasing shear strength with temperature (but at 300 °C it is still well above the MIL-STD requirement); Cu-Sn SLID bonds show only small changes; whereas Au-In SLID bonds show increased shear strength at 300 °C, accompanied with a change in fracture mode from brittle to ductile. All three behaviours can be explained from the phase diagrams with the actual phases in use.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Development of an electro-optical circuit board technology with embedded single-mode glass waveguide layer Influence of soft sensor chip bonds on the formation of wire bond interconnections Integrated printed hybrid electronics on paper Flip-chip bonding processes with low volume SoP technology Reliability performance of Au-Sn and Cu-Sn wafer level SLID bonds for MEMS
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1