化学束外延法高速生长Ga/sub 0.47/In/sub 0.53/As/InP

T. Uchida, T. Uchida, K. Mise, N. Yokouchi, F. Koyama, K. Iga
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引用次数: 1

摘要

采用化学束外延法对Ga/sub 0.47/In/sub 0.53/As和InP获得了较高的生长速率。GaInAs的生长速率控制在1.2 ~ 6 μ m/h之间,后者是在不牺牲晶体光学和电学性能的情况下获得的最高生长速率。以5.15和2.5 μ m/h的生长速率生长多量子阱,证明了良好的厚度可控性。在室温光致发光测量中观察到发射波长从1.56 μ m到1.1 μ m。根据x射线光谱卫星峰,与这些波长相关的井宽范围为80 AA至10 AA。结果与理论计算一致,在高生长速率下具有良好的厚度可控性和波长可调性。
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High rate growth of Ga/sub 0.47/In/sub 0.53/As/InP by chemical beam epitaxy
High growth rates have been obtained for Ga/sub 0.47/In/sub 0.53/As and InP using chemical beam epitaxy. The GaInAs growth rate was controlled over the range from 1.2 to 6 mu m/h, the latter being the highest growth rate obtained without sacrificing the optical and electrical properties of the crystal. Good thickness controllability was demonstrated by growing multi-quantum-wells at growth rates of 5.15 and 2.5 mu m/h. An emission wavelength shift from 1.56 mu m to 1.1 mu m was observed in room temperature photoluminescence measurements. Based on X-ray spectra satellite peaks, well widths associated with these wavelength ranged from 80 AA to 10 AA. The results agree with theoretical calculations and show good thickness controllability and wavelength tunability at high growth rates.<>
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