卤化物气相外延生长的氧化铟薄膜对氨的高灵敏度

IF 0.6 4区 物理与天体物理 Q4 PHYSICS, CONDENSED MATTER Semiconductors Pub Date : 2024-03-15 DOI:10.1134/s1063782623030028
D. A. Almaev, A. V. Almaev, V. I. Nikolaev, P. N. Butenko, M. P. Scheglov, A. V. Chikiryaka, A. I. Pechnikov
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引用次数: 0

摘要

研究了 H2、NH3、CO 和 O2 对通过卤化物气相外延生长的 In2O3 薄膜导电性能的影响。在 200-550°C 的温度范围内,In2O3 薄膜显示出对所有考虑气体的敏感性、相对较高的运行速度和循环的可重复性。对 NH3 的反应最大,在温度为 400°C 和气体浓度为 1000 ppm-1 时超过 33 arb.提出了 In2O3 薄膜对气体敏感的定性机制。将获得的气敏特性与基于各种材料的已知 In2O3 传感器进行了比较。结果表明,采用卤化物气相外延方法可以获得具有高气体灵敏度的氧化铟薄膜。
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High Sensitivity of Halide Vapor Phase Epitaxy Grown Indium Oxide Films to Ammonia

The effect of H2, NH3, CO and O2 on the electrically conductive properties of In2O3 films grown by halide vapor phase epitaxy has been studied. In the temperature range of 200−550°C, In2O3 films demonstrate gas sensitivity to all considered gases, a relatively high operation speed and repeatability of cycles. The greatest response to NH3 was obtained, which exceeded 33 arb. units at a temperature of 400°C and a gas concentration of 1000 ppm−1. A qualitative mechanism of gas sensitivity of In2O3 films is proposed. The obtained gas-sensitive characteristics are compared with known In2O3 sensors based on various materials. It is shown that the method of halide vapor phase epitaxy makes it possible to obtain indium oxide films with high gas sensitivity.

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来源期刊
Semiconductors
Semiconductors 物理-物理:凝聚态物理
CiteScore
1.50
自引率
28.60%
发文量
131
审稿时长
3-6 weeks
期刊介绍: Publishes the most important work in semiconductor research in the countries of the former Soviet Union. Covers semiconductor theory, transport phenomena in semiconductors, optics, magnetooptics, and electrooptics of semiconductors, semiconductor lasers and semiconductor surface physics. The journal features an extensive book review section.
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