Elizaveta Demyanenko, Christoph Feinauer, Enrico M Malatesta, Luca Saglietti
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Recent works demonstrated the existence of a double-descent phenomenon for the generalization error of neural networks, where highly overparameterized models escape overfitting and achieve good test performance, at odds with the standard bias-variance trade-off described by statistical learning theory. In the present work, we explore a link between this phenomenon and the increase of complexity and sensitivity of the function represented by neural networks. In particular, we study the Boolean mean dimension (BMD), a metric developed in the context of Boolean function analysis. Focusing on a simple teacher-student setting for the random feature model, we derive a theoretical analysis based on the replica method that yields an interpretable expression for the BMD, in the high dimensional regime where the number of data points, the number of features, and the input size grow to infinity. We find that, as the degree of overparameterization of the network is increased, the BMD reaches an evident peak at the interpolation threshold, in correspondence with the generalization error peak, and then slowly approaches a low asymptotic value. The same phenomenology is then traced in numerical experiments with different model classes and training setups. Moreover, we find empirically that adversarially initialized models tend to show higher BMD values, and that models that are more robust to adversarial attacks exhibit a lower BMD.
期刊介绍:
Machine Learning Science and Technology is a multidisciplinary open access journal that bridges the application of machine learning across the sciences with advances in machine learning methods and theory as motivated by physical insights. Specifically, articles must fall into one of the following categories: advance the state of machine learning-driven applications in the sciences or make conceptual, methodological or theoretical advances in machine learning with applications to, inspiration from, or motivated by scientific problems.