基于二氧化硅纳米颗粒合成的具有增强光电特性的聚合物纳米复合材料,可用于多功能技术应用

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-07-23 DOI:10.1007/s11664-024-11298-0
Majeed Ali Habeeb, Alaa Abass Mohammed, Nawras Karim Al-Sharifi, Idrees Oreibi, Rehab Shather Abdul Hamza
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引用次数: 0

摘要

通过溶液浇铸法获得了不同二氧化硅(SiO2)含量(0、2、4 和 6)的聚乙烯醇和聚乙烯吡咯烷酮(PVA/PVP)增强复合材料。对其电气和光学特性进行了研究。傅立叶变换红外线(FTIR)分析表明,二氧化硅 NPs 的加入导致了与聚合物基质的相互作用。傅立叶变换红外光谱分析显示了(PVA/PVP)聚合物基质与 SiO2 NPs 之间的物理相互作用。PVA/PVP/SiO2 纳米复合材料中 SiO2 纳米粒子比例的增加导致吸光度相应增加,透射率相应降低。PVA/PVP/SiO2 纳米复合材料的能隙有所减小,当二氧化硅纳米粒子的浓度为 6 wt.% 时,能隙从纯 PVA/PVP 的 4.2 eV 减小到允许间接转换的 2.6 eV,从 4 eV 减小到禁止间接转换的 2.6 eV。这一结果被认为是各种光学领域和光电纳米器件的关键。二氧化硅纳米粒子的重量百分比与其吸收系数、消光系数、折射率、介电常数的实部和虚部以及光导率呈正相关。对纳米复合材料的研究表明,二氧化硅纳米粒子浓度的增加会导致介电常数和介电损耗的增加,而外加电场频率的增加会导致这些特性的降低。频率和 SiO2 纳米粒子重量含量的增加会导致交流导电率的相应增加。研究结果证实,PVA/PVP/SiO2 薄膜纳米复合材料具有优异的光学和电学特性,可促进该纳米复合材料在不同电气和光电领域的应用。
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Synthesized Polymeric Nanocomposites with Enhanced Optical and Electrical Characteristics Based on SiO2 Nanoparticles for Multifunctional Technological Applications

Composites of polyvinyl alcohol and polyvinyl pyrrolidone (PVA/PVP) reinforced with different silicon dioxide (SiO2) loadings (0, 2, 4, and 6) wt.% were obtained via the solution casting method. The electrical and optical properties have been investigated. Fourier-transform infrared ray (FTIR) analysis revealed that the incorporation of SiO2 NPs resulted in an interaction with the polymer matrix. Physical interactions between the (PVA/PVP) polymer matrix and SiO2 NPs have been shown by FTIR analysis. The increase in SiO2 nanoparticle ratio in the PVA/PVP/SiO2 nanocomposite results in a corresponding increase in absorbance and decrease in transmittance. The PVA/PVP/SiO2 nanocomposite exhibited a reduction in energy gap, decreasing from 4.2 eV observed in pure PVA/PVP to 2.6 eV for allowed indirect transition and 4 eV to 2.6 eV for forbidden indirect transition, upon the incorporation of SiO2 nanoparticles at a concentration of 6 wt.%. This result is deemed a key for various optical fields and optoelectronics nanodevices. The weight percentages of SiO2 nanoparticles exhibit a positive correlation with their absorbing coefficient, extinction coefficient, index of refractive, real and imaginary components of dielectric constants, and optical conductivity. The investigation of the nanocomposites has revealed that an increase in the concentration of SiO2 nanoparticles leads to an elevation in both the dielectric constant and dielectric loss, while an increase in the frequency of the applied electric field results in a decrease in these properties. The increase in frequency and weight content of SiO2 NPs results in a corresponding increase in AC electrical conductivity. The results confirm that PVA/PVP/SiO2 films nanocomposites have excellent optical and electrical properties, which could encourage the nanocomposites' application in different electric and optoelectric uses.

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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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