无铅全无机过氧化物太阳能电池中电荷传输层与不同吸收体之间界面动力学的理论分析

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-09-02 DOI:10.1007/s11664-024-11372-7
Md. Ariful Islam, Md. Mahfuzul Haque, Vidhya Selvanathan, M. Mottakin, D. K. Sarkar, Khurram Joya, Abdulaziz M. Alanazi, Takashi Suemasu, Ishtiaque M Syed, Md. Akhtaruzzaman
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引用次数: 0

摘要

尽管包光体太阳能电池(PSCs)因其良好的光电特性、成本效益和高效率而成为第三代太阳能电池的潜在候选者,引起了人们的广泛关注,但与器件稳定性和包光体(PSK)层的毒性有关的一些问题阻碍了 PSCs 的商业可行性。有机 PSK 卤化物固有的不稳定性和铅的毒性迫使研究人员将重点放在开发无铅全无机 PSCs 上,方法是用无机(Cs+)阳离子取代有机物作为更安全的替代品。本研究利用 SCAPS-1D 模拟器研究了具有三种不同 PSK 层(CsGeI3、CsSnI3 和 Cs2TiI6)的无机无铅铯基 PSCs 的电池性能,其中无机 ZnO 和 CuSCN 分别用作电子传输层(ETL)和空穴传输层(HTL)。结果发现,基于 Cs2TiI6 的 PSC 性能最佳。然后,研究了 PSK 层的缺陷容忍度以及带偏移对电池性能的影响。结果发现,导带偏移(CBO)和价带偏移(VBO)的最佳值分别为 0 eV 和 - 0.1 eV 至 0 eV。此外,还根据 CBO 和 VBO 的函数分析了 ETL/PSK 和 PSK/HTL 界面上的界面缺陷对电池性能的影响。这项研究观察到,当界面上的 CBO 和 VBO 为负值时,重组率很高。因此,这些发现将指导研究人员利用合适的无机无铅包晶和电荷传输层开发高性能的 PSC。
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Theoretical Analysis on Interfacial Dynamics Between Charge Transport Layer and Different Absorbers in Pb-free All Inorganic Perovskites Solar Cells

Although perovskite solar cells (PSCs) have captured notable interest as a potential candidate for third-generation solar cells, due to their favorable optoelectronic properties, cost-effectiveness, and high efficiency, some issues related to device stability and toxicity of the perovskite (PSK) layer hinders the commercial viability of PSCs. The inherent instability of organic PSK halides and the toxicity of Pb has compelled researchers to focus on developing Pb-free all-inorganic PSCs by replacing the organic species with inorganic (Cs+) cations as a safer alternative. In this study, the SCAPS-1D simulator was employed to investigate the cell performances of all-inorganic Pb-free Cs-based PSCs with three different PSK layers (CsGeI3, CsSnI3, and Cs2TiI6) individually, where inorganic ZnO and CuSCN were used as the electron transport layer (ETL) and the hole transport layer (HTL), respectively. The Cs2TiI6-based PSC was found to have the best performance. Then, the defect tolerance level of the PSK layer and the impact of band offset on cell performances were investigated. The optimum values of the conduction band offset (CBO) and the valence band offset (VBO) were found to be 0 eV and between − 0.1 eV and 0 eV, respectively. Moreover, the effect of interface defects at the ETL/PSK and PSK/HTL interfaces on cell performance was also analyzed as a function of CBO and VBO and, for both cases, the interface defect tolerance limit was recorded as 1016 cm−2. This study observed a high rate of recombination for negative values of CBO and VBO at the interfaces. Thus, these findings will guide researchers in developing high-performance PSCs with suitable inorganic Pb-free perovskite and charge transport layers.

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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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