影响掺镓 PERC 单面光伏组件标准 PID 测试和抗 PID 性能的因素

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-09-25 DOI:10.1007/s11664-024-11471-5
Rui Tong, Wenfei Wu, Zhi Wang
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引用次数: 0

摘要

电位诱发衰减(PID)性能对光伏(PV)模块具有重要意义。根据 IEC 61215-2:2021 标准,我们分析了影响 PID 性能测量的因素,包括光浸泡 p 型掺镓(Ga)硅单面光伏组件、环境室加湿用水的电阻率和环境室相对湿度的影响。我们还考察了组件在氯化钠溶液侵蚀和较高湿度与氯化钠溶液共同侵蚀下抗 PID 性能的变化。结果表明,在对模块进行 PID 测试前进行轻度浸泡预处理会导致平均功率损失相差 0.02%。环境室中使用的不同电阻率的加湿水对 PID 测试的影响可以忽略不计。湿度的增加会大大降低模块的抗 PID 性能。当 EVA 薄膜厚度从 0.65 毫米减少到 0.55 毫米时,PID 测试后的功率损耗从 2.25% 增加到 3.96%。此外,在外加电场条件下,模块背板上的氯化钠会加速 PID 效应,导致在电致发光(EL)图像下观察到局部变暗区域的形成。最后,在较高湿度和 NaCl 溶液条件下进行 PID 测试后,组件的平均功率损失达 10.80%,而标准 PID 测试后组件的平均功率损失为 1.29%。因此,提高单面光伏组件在高相对湿度和盐雾环境下的抗 PID 性能至关重要。
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Factors Influencing Standard PID Test and Anti-PID Performance of Ga-Doped PERC Mono-Facial Photovoltaic Modules

The potential-induced degradation (PID) performance is of high significance for photovoltaic (PV) modules. In accordance with the IEC 61215-2: 2021 standard, we analyzed the factors that affect the measurement of PID performance, including the effects of a light soak of the p-type gallium (Ga)-doped silicon mono-facial PV modules, the resistivity of the water used for humidification of the environmental chamber, and the relative humidity of the chamber. We also examined the change of the modules’ anti-PID performance under the erosion by NaCl solution and by higher humidity combined with NaCl solution. The results show that a light soak pre-treatment before the PID test of the module leads to a difference of 0.02% in average power loss. The influence of humidifying water with different resistivities used in the environmental chamber on the PID test is negligible. An increase in humidity substantially reduces the anti-PID performance of the module. When the EVA film thickness was reduced from 0.65 mm to 0.55 mm, the power loss increased from 2.25% to 3.96% after the PID test. In addition, NaCl on the backsheet of the module could accelerate the PID effect under applied electric field conditions, resulting in the formation of localized darkening area observed under electroluminescence (EL) image. Finally, after the PID test in the presence of higher humidity and NaCl solution, the average power loss of the modules amounted to 10.80%, while it was 1.29% for the modules after the standard PID test. Therefore, it is vital to improve the anti-PID performance of mono-facial PV modules in a high relative humidity and salt-mist environment.

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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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