Liping Yu , Ning Lu , Kefei Lu , Xuefeng Zou , Bing Pan
{"title":"紫外线时间门控主动成像数字图像相关性:超高温变形测量的新型解决方案","authors":"Liping Yu , Ning Lu , Kefei Lu , Xuefeng Zou , Bing Pan","doi":"10.1016/j.optlastec.2024.111971","DOIUrl":null,"url":null,"abstract":"<div><div>Active-imaging digital image correlation (DIC) based on monochromatic illumination and optical bandpass filtering provides a simple and effective approach to measure the surface deformation of test materials and structures at elevated temperatures. However, when the sample temperature exceeds 2000 °C or strong thermal radiation from heating elements is present, the current active-imaging strategy fails to effectively suppress the massive thermal radiation from the heated sample and heating elements. Here, we present an ultraviolet (UV) time-gated active-imaging technique that employs a gated single-photon camera to significantly reduce exposure time and a UV bandpass filter to block most thermal radiation. This combination of UV bandpass filtering in the spectral domain and time-gated imaging at UV wavelengths in the time domain suppresses the enormous thermal radiation from the heated sample and heating source to a negligible level compared with the active illumination. Real-world validations, including full-field thermal deformation measurement of a Ni-based alloy sample, thermal strain measurement at 2800 °C, and tensile strain measurement at 2500 °C of carbon-carbon composite material samples, verified the performance of the proposed method. Beyond its current applications, the ultraviolet time-gated active-imaging DIC method holds promise as a powerful tool for characterizing the thermo-mechanical properties of materials and structures in extremely high-temperature environments.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"181 ","pages":"Article 111971"},"PeriodicalIF":4.6000,"publicationDate":"2024-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ultraviolet time-gated active-imaging digital image correlation: A novel solution for ultra-high temperature deformation measurement\",\"authors\":\"Liping Yu , Ning Lu , Kefei Lu , Xuefeng Zou , Bing Pan\",\"doi\":\"10.1016/j.optlastec.2024.111971\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Active-imaging digital image correlation (DIC) based on monochromatic illumination and optical bandpass filtering provides a simple and effective approach to measure the surface deformation of test materials and structures at elevated temperatures. However, when the sample temperature exceeds 2000 °C or strong thermal radiation from heating elements is present, the current active-imaging strategy fails to effectively suppress the massive thermal radiation from the heated sample and heating elements. Here, we present an ultraviolet (UV) time-gated active-imaging technique that employs a gated single-photon camera to significantly reduce exposure time and a UV bandpass filter to block most thermal radiation. This combination of UV bandpass filtering in the spectral domain and time-gated imaging at UV wavelengths in the time domain suppresses the enormous thermal radiation from the heated sample and heating source to a negligible level compared with the active illumination. Real-world validations, including full-field thermal deformation measurement of a Ni-based alloy sample, thermal strain measurement at 2800 °C, and tensile strain measurement at 2500 °C of carbon-carbon composite material samples, verified the performance of the proposed method. Beyond its current applications, the ultraviolet time-gated active-imaging DIC method holds promise as a powerful tool for characterizing the thermo-mechanical properties of materials and structures in extremely high-temperature environments.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"181 \",\"pages\":\"Article 111971\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2024-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399224014294\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399224014294","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Ultraviolet time-gated active-imaging digital image correlation: A novel solution for ultra-high temperature deformation measurement
Active-imaging digital image correlation (DIC) based on monochromatic illumination and optical bandpass filtering provides a simple and effective approach to measure the surface deformation of test materials and structures at elevated temperatures. However, when the sample temperature exceeds 2000 °C or strong thermal radiation from heating elements is present, the current active-imaging strategy fails to effectively suppress the massive thermal radiation from the heated sample and heating elements. Here, we present an ultraviolet (UV) time-gated active-imaging technique that employs a gated single-photon camera to significantly reduce exposure time and a UV bandpass filter to block most thermal radiation. This combination of UV bandpass filtering in the spectral domain and time-gated imaging at UV wavelengths in the time domain suppresses the enormous thermal radiation from the heated sample and heating source to a negligible level compared with the active illumination. Real-world validations, including full-field thermal deformation measurement of a Ni-based alloy sample, thermal strain measurement at 2800 °C, and tensile strain measurement at 2500 °C of carbon-carbon composite material samples, verified the performance of the proposed method. Beyond its current applications, the ultraviolet time-gated active-imaging DIC method holds promise as a powerful tool for characterizing the thermo-mechanical properties of materials and structures in extremely high-temperature environments.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems