Pr6O11 稀土氧化物对聚乙烯醇薄膜结构特性和光学参数的影响

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-11-15 DOI:10.1007/s10854-024-13779-8
T. S. Soliman, Sh. I. Elkalashy, Mahmoud M. Hessien
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引用次数: 0

摘要

利用浇铸法制备的不同含量的氧化镨(Pr6O11)首次被嵌入到聚乙烯醇(PVA)基质中。近来,稀土氧化物与聚合物基质的结合在光学应用中获得了广泛关注。在本研究中,我们关注的是 Pr6O11 对 PVA 的形态和带隙能的影响。我们通过 X 射线衍射 (XRD)、拉曼、傅立叶变换红外 (FTIR) 和扫描电子显微镜 (SEM) 技术测定了 PVA 的结构和形态。X 射线衍射显示,Pr6O11 对 PVA 的特征峰产生了影响,表明 PVA 的结构发生了变化,产生了新的结构。傅立叶变换红外光谱和拉曼分析表明了 Pr6O11 纳米粒子与 PVA 的官能团之间的结合和相互作用。通过紫外-可见分光光度计记录的吸光度数据研究了光学常数。加入 4 wt.% 的 Pr6O11 纳米粒子后,PVA 的带隙能(直接/间接)降至 4.51/2.13 eV,折射率升至 2.0902。其他光学参数的测定结果表明,在 PVA 基体中添加 Pr6O11 后,光学参数有所改善。所获得的基质在光学材料应用方面表现出了良好的特性。
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Effect of Pr6O11 rare-earth oxide on the structural characteristics and optical parameters of polyvinyl alcohol film

Praseodymium oxide (Pr6O11) was embedded in the polyvinyl alcohol (PVA) matrix with different contents for the first time, using the casting method for preparation. Combining rare earth oxides with a polymer matrix has gained a lot of interest in optical applications lately. The impact of Pr6O11 on the PVA’s morphology and bandgap energy was our interest in the present study. PVA’s structure and morphology were determined via X-ray diffraction (XRD), Raman, Fourier transform infrared (FTIR), and scanning electron microscope (SEM) techniques. The XRD showed the influence of Pr6O11 on the characteristic peak of the PVA, indicating the change in the PVA’s structure and producing a new one. FTIR and Raman analyses demonstrated the combination and interaction between the Pr6O11 nanoparticles and the functional groups of the PVA. The optical constants were investigated through the absorbance data recorded from the UV–Visible spectrophotometer. The PVA’s bandgap energy (direct/indirect) was reduced to 4.51/2.13 eV, and the refractive index increased to 2.0902 after adding 4 wt.% Pr6O11 nanoparticles. Other optical parameters were determined and showed an improvement with the additive of Pr6O11 to the PVA matrix. The obtained matrix showed promising characteristics for optical materials applications.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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