基于Dirac解的相对论EELS微分析散射截面。

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2025-03-01 Epub Date: 2024-12-02 DOI:10.1016/j.ultramic.2024.114083
Zezhong Zhang, Ivan Lobato, Hamish Brown, Dirk Lamoen, Daen Jannis, Johan Verbeeck, Sandra Van Aert, Peter D Nellist
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引用次数: 0

摘要

电子能量损失谱(EELS)的丰富信息来自于复杂的非弹性散射过程,即快速电子将能量和动量传递给原子,将束缚电子从基态激发到更高的未占据态。为了量化EELS,通常的做法是比较能量窗口内集成的横截面,或者将观测到的光谱与从具有实验参数的广义振荡器强度(GOS)数据库计算的理论微分横截面拟合。以前基于hartree - fock和dft的GOS是根据Schrödinger的原子轨道解计算的,没有包括完整的相对论效应。在这里,我们试图超越GOS表中Schrödinger解的局限性,利用Dirac方程在局部密度近似中包含完整的相对论效应,这对于具有强自旋轨道耦合的重元素的核壳电子尤其重要。使用现代计算能力和并行化算法,对周期表中所有可能的激发边的所有元素(直到Z = 118)都进行了此操作。为了计算特定于加速电压的截面,考虑了快速进入电子的相对论效应。我们在开源许可下提供这些表格GOS,以使学术用户受益,并允许集成到商业解决方案中。
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Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions.

The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, exciting bound electrons from their ground states to higher unoccupied states. To quantify EELS, the common practice is to compare the cross-sections integrated within an energy window or fit the observed spectrum with theoretical differential cross-sections calculated from a generalized oscillator strength (GOS) database with experimental parameters. The previous Hartree-Fock-based and DFT-based GOS are calculated from Schrödinger's solution of atomic orbitals, which does not include the full relativistic effects. Here, we attempt to go beyond the limitations of the Schrödinger solution in the GOS tabulation by including the full relativistic effects using the Dirac equation within the local density approximation, which is particularly important for core-shell electrons of heavy elements with strong spin-orbit coupling. This has been done for all elements in the periodic table (up to Z = 118) for all possible excitation edges using modern computing capabilities and parallelization algorithms. The relativistic effects of fast incoming electrons were included to calculate cross-sections that are specific to the acceleration voltage. We make these tabulated GOS available under an open-source license to the benefit of both academic users and to allow integration into commercial solutions.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
期刊最新文献
Aberration calculation of microlens array using differential algebraic method. Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions. Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization. Workflow automation of SEM acquisitions and feature tracking. Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force.
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