{"title":"短路条件下低压断路器的数值分析","authors":"T. Mutzel, F. Berger, M. Anheuser","doi":"10.1109/HOLM.2007.4318192","DOIUrl":null,"url":null,"abstract":"Short-circuits in electrical networks come along with severe mechanical and thermal stresses not only to loads and systems, but also to the installed protection devices. Combined analytical simulations have been performed for analyzing and optimizing the behavior of low-voltage circuit-breakers. Especially circuit-breakers with electronic tripping units have been scrutinized.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Numerical Analysis of Low-Voltage Circuit-Breakers under Short-Circuit Conditions\",\"authors\":\"T. Mutzel, F. Berger, M. Anheuser\",\"doi\":\"10.1109/HOLM.2007.4318192\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Short-circuits in electrical networks come along with severe mechanical and thermal stresses not only to loads and systems, but also to the installed protection devices. Combined analytical simulations have been performed for analyzing and optimizing the behavior of low-voltage circuit-breakers. Especially circuit-breakers with electronic tripping units have been scrutinized.\",\"PeriodicalId\":11624,\"journal\":{\"name\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2007.4318192\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Numerical Analysis of Low-Voltage Circuit-Breakers under Short-Circuit Conditions
Short-circuits in electrical networks come along with severe mechanical and thermal stresses not only to loads and systems, but also to the installed protection devices. Combined analytical simulations have been performed for analyzing and optimizing the behavior of low-voltage circuit-breakers. Especially circuit-breakers with electronic tripping units have been scrutinized.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
