H. Sim, Hyejung Choi, Dongsoo Lee, M. Chang, Dooho Choi, Y. Son, Eun-Hong Lee, Wonjoo Kim, Yoondong Park, I. Yoo, H. Hwang
{"title":"Pt/SrTiO/sub - 3/肖特基结具有优异的电阻开关特性,可用于多位非易失性存储器","authors":"H. Sim, Hyejung Choi, Dongsoo Lee, M. Chang, Dooho Choi, Y. Son, Eun-Hong Lee, Wonjoo Kim, Yoondong Park, I. Yoo, H. Hwang","doi":"10.1109/IEDM.2005.1609464","DOIUrl":null,"url":null,"abstract":"We have investigated single crystal Nb-doped SrTiO<sub>3</sub> in terms of its potential utility in nonvolatile memory applications. Compared with polycrystalline oxide (Nb<sub>2</sub>O<sub>5</sub>, ZrO <sub>x</sub> and Cr-SrTiO<sub>3</sub>), the Pt/single crystal Nb:SrTiO <sub>3</sub> Schottky junction exhibits excellent memory characteristics including uniformity of set/reset bias, die-to-die reproducibility, data retention at high temperature, reliability under cycle stress, and multi-bit operation characteristics. The switching mechanism might be explained by modulation of the Schottky barrier height by charge trapping at the interface","PeriodicalId":13071,"journal":{"name":"IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.","volume":"31 1","pages":"758-761"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":"{\"title\":\"Excellent resistance switching characteristics of Pt/SrTiO/sub 3/ schottky junction for multi-bit nonvolatile memory application\",\"authors\":\"H. Sim, Hyejung Choi, Dongsoo Lee, M. Chang, Dooho Choi, Y. Son, Eun-Hong Lee, Wonjoo Kim, Yoondong Park, I. Yoo, H. Hwang\",\"doi\":\"10.1109/IEDM.2005.1609464\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have investigated single crystal Nb-doped SrTiO<sub>3</sub> in terms of its potential utility in nonvolatile memory applications. Compared with polycrystalline oxide (Nb<sub>2</sub>O<sub>5</sub>, ZrO <sub>x</sub> and Cr-SrTiO<sub>3</sub>), the Pt/single crystal Nb:SrTiO <sub>3</sub> Schottky junction exhibits excellent memory characteristics including uniformity of set/reset bias, die-to-die reproducibility, data retention at high temperature, reliability under cycle stress, and multi-bit operation characteristics. The switching mechanism might be explained by modulation of the Schottky barrier height by charge trapping at the interface\",\"PeriodicalId\":13071,\"journal\":{\"name\":\"IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.\",\"volume\":\"31 1\",\"pages\":\"758-761\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"46\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2005.1609464\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2005.1609464","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Excellent resistance switching characteristics of Pt/SrTiO/sub 3/ schottky junction for multi-bit nonvolatile memory application
We have investigated single crystal Nb-doped SrTiO3 in terms of its potential utility in nonvolatile memory applications. Compared with polycrystalline oxide (Nb2O5, ZrO x and Cr-SrTiO3), the Pt/single crystal Nb:SrTiO 3 Schottky junction exhibits excellent memory characteristics including uniformity of set/reset bias, die-to-die reproducibility, data retention at high temperature, reliability under cycle stress, and multi-bit operation characteristics. The switching mechanism might be explained by modulation of the Schottky barrier height by charge trapping at the interface