{"title":"片上皮秒时间测量","authors":"V. Gutnik, A. Chandrakasan","doi":"10.1109/VLSIC.2000.852849","DOIUrl":null,"url":null,"abstract":"A flash Time to Digital Converter (TDC) can be calibrated to a precision on the order of the arbiter aperature without precise input signals. A theoretical result useful for calibration of a noise-limited arbiter array is derived, and verified empirically. A test chip with 64 arbiters in a 0.35 /spl mu/m CMOS process shows temporal resolution better than 2 picoseconds.","PeriodicalId":6361,"journal":{"name":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","volume":"24 1","pages":"52-53"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"68","resultStr":"{\"title\":\"On-chip picosecond time measurement\",\"authors\":\"V. Gutnik, A. Chandrakasan\",\"doi\":\"10.1109/VLSIC.2000.852849\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A flash Time to Digital Converter (TDC) can be calibrated to a precision on the order of the arbiter aperature without precise input signals. A theoretical result useful for calibration of a noise-limited arbiter array is derived, and verified empirically. A test chip with 64 arbiters in a 0.35 /spl mu/m CMOS process shows temporal resolution better than 2 picoseconds.\",\"PeriodicalId\":6361,\"journal\":{\"name\":\"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)\",\"volume\":\"24 1\",\"pages\":\"52-53\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"68\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2000.852849\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2000.852849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A flash Time to Digital Converter (TDC) can be calibrated to a precision on the order of the arbiter aperature without precise input signals. A theoretical result useful for calibration of a noise-limited arbiter array is derived, and verified empirically. A test chip with 64 arbiters in a 0.35 /spl mu/m CMOS process shows temporal resolution better than 2 picoseconds.