{"title":"关于紧测试集的生成","authors":"Amit Kumar, J. Rajski, S. Reddy, Chen Wang","doi":"10.1109/TEST.2013.6651914","DOIUrl":null,"url":null,"abstract":"New methods are proposed to guide line justification and fault propagation in test generation procedures to derive compact test sets. Experiments on several industrial designs yielded, on average, 24% reduction in test set sizes.","PeriodicalId":6379,"journal":{"name":"2013 IEEE International Test Conference (ITC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"On the generation of compact test sets\",\"authors\":\"Amit Kumar, J. Rajski, S. Reddy, Chen Wang\",\"doi\":\"10.1109/TEST.2013.6651914\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New methods are proposed to guide line justification and fault propagation in test generation procedures to derive compact test sets. Experiments on several industrial designs yielded, on average, 24% reduction in test set sizes.\",\"PeriodicalId\":6379,\"journal\":{\"name\":\"2013 IEEE International Test Conference (ITC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2013.6651914\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New methods are proposed to guide line justification and fault propagation in test generation procedures to derive compact test sets. Experiments on several industrial designs yielded, on average, 24% reduction in test set sizes.
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