S. Arasu, M. Nourani, J. Carulli, K. Butler, V. Reddy
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A design-for-reliability approach based on grading library cells for aging effects
A realistic, as opposed to fixed pessimistic end-of-life method to identify paths that are at-risk to excessive degradation due to aging is presented. It uses library cell grading information to assess the cells/instances for their sensitivity to parametric degradation.
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