{"title":"光学吸收层厚度对倒置结构有机位置敏感探测器测量精度的影响","authors":"T. Morimune","doi":"10.7567/ssdm.2017.ps-10-10","DOIUrl":null,"url":null,"abstract":"The influence of the organic optical absorbing thickness on measurement accuracy is investigated in one-dimensional organic-sensitive detectors using Al doped ZnO resistive layer. The linearity has been increased as the optical absorbing layer becomes thicker and the maximum measurement error has been improved by increasing the sensitivity of the active layer.","PeriodicalId":22504,"journal":{"name":"The Japan Society of Applied Physics","volume":"6 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2017-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors\",\"authors\":\"T. Morimune\",\"doi\":\"10.7567/ssdm.2017.ps-10-10\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of the organic optical absorbing thickness on measurement accuracy is investigated in one-dimensional organic-sensitive detectors using Al doped ZnO resistive layer. The linearity has been increased as the optical absorbing layer becomes thicker and the maximum measurement error has been improved by increasing the sensitivity of the active layer.\",\"PeriodicalId\":22504,\"journal\":{\"name\":\"The Japan Society of Applied Physics\",\"volume\":\"6 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Japan Society of Applied Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.7567/ssdm.2017.ps-10-10\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Japan Society of Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2017.ps-10-10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors
The influence of the organic optical absorbing thickness on measurement accuracy is investigated in one-dimensional organic-sensitive detectors using Al doped ZnO resistive layer. The linearity has been increased as the optical absorbing layer becomes thicker and the maximum measurement error has been improved by increasing the sensitivity of the active layer.