光学吸收层厚度对倒置结构有机位置敏感探测器测量精度的影响

T. Morimune
{"title":"光学吸收层厚度对倒置结构有机位置敏感探测器测量精度的影响","authors":"T. Morimune","doi":"10.7567/ssdm.2017.ps-10-10","DOIUrl":null,"url":null,"abstract":"The influence of the organic optical absorbing thickness on measurement accuracy is investigated in one-dimensional organic-sensitive detectors using Al doped ZnO resistive layer. The linearity has been increased as the optical absorbing layer becomes thicker and the maximum measurement error has been improved by increasing the sensitivity of the active layer.","PeriodicalId":22504,"journal":{"name":"The Japan Society of Applied Physics","volume":"6 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2017-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors\",\"authors\":\"T. Morimune\",\"doi\":\"10.7567/ssdm.2017.ps-10-10\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of the organic optical absorbing thickness on measurement accuracy is investigated in one-dimensional organic-sensitive detectors using Al doped ZnO resistive layer. The linearity has been increased as the optical absorbing layer becomes thicker and the maximum measurement error has been improved by increasing the sensitivity of the active layer.\",\"PeriodicalId\":22504,\"journal\":{\"name\":\"The Japan Society of Applied Physics\",\"volume\":\"6 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Japan Society of Applied Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.7567/ssdm.2017.ps-10-10\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Japan Society of Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2017.ps-10-10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

采用掺铝ZnO电阻层,研究了一维有机敏感探测器中有机光吸收厚度对测量精度的影响。随着光吸收层厚度的增加,线性度得到了提高,同时通过提高有源层的灵敏度,最大测量误差得到了改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
The influence of optical absorbing layer thickness on measurement accuracy in inverted structure organic position-sensitive detectors
The influence of the organic optical absorbing thickness on measurement accuracy is investigated in one-dimensional organic-sensitive detectors using Al doped ZnO resistive layer. The linearity has been increased as the optical absorbing layer becomes thicker and the maximum measurement error has been improved by increasing the sensitivity of the active layer.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Transient Absorption Spectroscopy of TlBr Crystals Using Pulsed Electron Beams Fabrication of Recessed-Gate AlGaN/GaN Hemts Utilizing Contactless Photo-Electrochemical (CL-PEC) Etching Inductively Coupled Plasma Sputtering System for Oxide Semiconductors for a Large Area Deposition Removal of Metal Ions from Water Using Oxygen Plasmas Effect of Mo, W Substitution on Ferroelectric Characteristics, Crystal and Electronic Structure of Bi0.5K0.5TiO3-BiFeO3-KTaO3 Based Ferroelectric Ceramics
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1