实验室和商用断路器开关接触电阻的威布尔分析

C. Leung, E. Streicher, D. Fitzgerald
{"title":"实验室和商用断路器开关接触电阻的威布尔分析","authors":"C. Leung, E. Streicher, D. Fitzgerald","doi":"10.1109/HOLM.2007.4318195","DOIUrl":null,"url":null,"abstract":"Silver/tungsten powder metal electric contacts are used in circuit breakers because of their combination of high conductivity from silver, and high melting temperature from tungsten. In operations of the circuit breaker, switching arcs erode and oxidize the contact surface to create a high resistance layer that can lead to high temperature at the contacts. This arc erosion product is usually a mixture of silver, tungsten, tungsten oxides and silver tungstate. The formation of this layer and its distribution is modified by the metallurgy and electrical parameters. The measurement of the contact resistance depends on the random location of the contact spot and is therefore highly statistical in nature. Weibull distribution is used to analyze switching contact resistance in laboratory switch apparatus and commercial 20A circuit breakers. This is to understand the statistical nature of the measurement and the correlation to the dynamic contact erosion process.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Weibull Analysis of Switching Contact Resistance in Laboratory and Commercial Circuit Breakers\",\"authors\":\"C. Leung, E. Streicher, D. Fitzgerald\",\"doi\":\"10.1109/HOLM.2007.4318195\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silver/tungsten powder metal electric contacts are used in circuit breakers because of their combination of high conductivity from silver, and high melting temperature from tungsten. In operations of the circuit breaker, switching arcs erode and oxidize the contact surface to create a high resistance layer that can lead to high temperature at the contacts. This arc erosion product is usually a mixture of silver, tungsten, tungsten oxides and silver tungstate. The formation of this layer and its distribution is modified by the metallurgy and electrical parameters. The measurement of the contact resistance depends on the random location of the contact spot and is therefore highly statistical in nature. Weibull distribution is used to analyze switching contact resistance in laboratory switch apparatus and commercial 20A circuit breakers. This is to understand the statistical nature of the measurement and the correlation to the dynamic contact erosion process.\",\"PeriodicalId\":11624,\"journal\":{\"name\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2007.4318195\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

银/钨粉末金属电触点用于断路器,因为它们结合了银的高导电性和钨的高熔化温度。在断路器的操作中,开关电弧侵蚀和氧化接触表面,形成高电阻层,导致接触处高温。这种电弧侵蚀产物通常是银、钨、钨氧化物和钨酸银的混合物。该层的形成及其分布受冶金参数和电参数的影响。接触电阻的测量取决于接触点的随机位置,因此在本质上是高度统计的。威布尔分布用于分析实验室开关设备和商用20A断路器的开关接触电阻。这是为了了解测量的统计性质及其与动态接触侵蚀过程的相关性。
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Weibull Analysis of Switching Contact Resistance in Laboratory and Commercial Circuit Breakers
Silver/tungsten powder metal electric contacts are used in circuit breakers because of their combination of high conductivity from silver, and high melting temperature from tungsten. In operations of the circuit breaker, switching arcs erode and oxidize the contact surface to create a high resistance layer that can lead to high temperature at the contacts. This arc erosion product is usually a mixture of silver, tungsten, tungsten oxides and silver tungstate. The formation of this layer and its distribution is modified by the metallurgy and electrical parameters. The measurement of the contact resistance depends on the random location of the contact spot and is therefore highly statistical in nature. Weibull distribution is used to analyze switching contact resistance in laboratory switch apparatus and commercial 20A circuit breakers. This is to understand the statistical nature of the measurement and the correlation to the dynamic contact erosion process.
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