镀锡触点微动腐蚀的显微研究

T. Ito, Y. Hattori, K. Iida, Y. Saitoh
{"title":"镀锡触点微动腐蚀的显微研究","authors":"T. Ito, Y. Hattori, K. Iida, Y. Saitoh","doi":"10.1109/HOLM.2007.4318220","DOIUrl":null,"url":null,"abstract":"In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in cars for the comfort of the passengers. In this report, we made fretting test samples of connectors for which contact resistance had increased and analyzed the cross-section of the contact points using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) and micro hardness measurement. Based on the observation and measurement results, we considered the change of the contact microstructure for various fretting cycles.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"9 1","pages":"216-221"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Microscopy Study of Fretting Corrosion of Tin Plated Contacts\",\"authors\":\"T. Ito, Y. Hattori, K. Iida, Y. Saitoh\",\"doi\":\"10.1109/HOLM.2007.4318220\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in cars for the comfort of the passengers. In this report, we made fretting test samples of connectors for which contact resistance had increased and analyzed the cross-section of the contact points using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) and micro hardness measurement. Based on the observation and measurement results, we considered the change of the contact microstructure for various fretting cycles.\",\"PeriodicalId\":11624,\"journal\":{\"name\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"volume\":\"9 1\",\"pages\":\"216-221\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2007.4318220\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318220","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

近年来,由于电子设备的体积越来越大,为了乘客的舒适度,汽车中分配给电子设备的安装空间越来越小,因此对汽车中线束连接器的小型化需求越来越大。在本报告中,我们制作了接触电阻增加的连接器的微动测试样品,并使用扫描电子显微镜(SEM)和透射电子显微镜(TEM)和显微硬度测量分析了接触点的横截面。在观察和测量结果的基础上,考虑了不同微动周期接触微观结构的变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Microscopy Study of Fretting Corrosion of Tin Plated Contacts
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in cars for the comfort of the passengers. In this report, we made fretting test samples of connectors for which contact resistance had increased and analyzed the cross-section of the contact points using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) and micro hardness measurement. Based on the observation and measurement results, we considered the change of the contact microstructure for various fretting cycles.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Numerical Analysis of Low-Voltage Circuit-Breakers under Short-Circuit Conditions Influence of Surface Roughness on Contact Voltage Drop of Electrical Sliding Contacts Benchmark Tests of Single-Break and Double-Break Design Principles An Experimental Study of Arc Duration and Transition from Metallic to Gaseous Phase in Ag Alloy Break Arc Thermal Analysis of Sealed Electromagnetic Relays Using 3-D Finite Element Method
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1