采用1.5 V、0.18 /spl mu/m CMOS块体技术,实现2 GHz周期、430 ps访问时间、34 Kb L1目录SRAM

R. Joshi, S. Kowalczyk, Y. Chan, W. Huott, S.C. Wilson, G. J. Scharff
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引用次数: 10

摘要

本文介绍了在1.5 V、0.18 /spl mu/m CMOS块体技术下,读取访问时间低于430ps、周期为2ghz的高速L1目录(34kb)。这种高性能动态设计的主要特点是快速静态输入/输出接口,提供将内部信号从静态转换为动态,然后在输出处返回静态,L1/L2锁存器在输入处,模块化构建模块,伪静态电路,健壮的定时计划以及使用可编程的“阵列内置自检”(ABIST)进行广泛测试模式覆盖和访问时间评估的能力。
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A 2 GHz cycle, 430 ps access time 34 Kb L1 directory SRAM in 1.5 V, 0.18 /spl mu/m CMOS bulk technology
This paper describes a high speed L1 directory (34 Kb) with read access time below 430 ps and a cycle of 2 GHz in 1.5 V, 0.18 /spl mu/m CMOS bulk technology. The key features of this high performance dynamic design are fast static input/output interface with the provision of converting internal signals from static to dynamic and then back to static at the output, L1/L2 latches at the input, modular building blocks, pseudo-static circuits, robust timing plan and capability for extensive test pattern coverage and access time evaluation using a programmable "Array-Built-In-Self-Test" (ABIST).
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