Sameer Singh, M. Govindarajan, T. Venkatesh, W. Evans, A. Kansal, S. S. Murali
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引用次数: 1
摘要
本文介绍了一种12位290MS/s两级时间交错(TI) SAR ADC的设计技术,该ADC在不需要背景数字校准的情况下,最大限度地减少了多个高分辨率核心之间的采样倾斜和增益不匹配。使用了一种允许共享单个参考缓冲区和在MSB和LSB位之间最佳分配转换时间的定时方案。通过使用过程、电压和温度(PVT)不变异步定时环路,进一步优化功率,避免了悲观余量并简化了设计。该ADC在台积电28HPM工艺中实现,实现了23fJ/反步的高输入频率优值(FoM)。其高频Schreier FoM为165.3dB,是该采样范围内报道的最高数值。该架构扩展为实现12位460MS/s的ADC,其中两个这样的实例交错以实现30fJ/反步的FoM和大于70dB的SFDR。
A 23fJ/conv-step 12b 290MS/s time interleaved pipelined SAR ADC
This paper describes the techniques used in the design of a 12-bit 290MS/s two stage time interleaved (TI) SAR ADC that minimizes the sampling skew and gain mismatches between multiple high resolution cores without the need for background digital calibration. A timing scheme which allows sharing of a single reference buffer and optimal distribution of conversion time among MSB and LSB bits is used. Further optimization in power is achieved by use of a process, voltage and temperature (PVT) invariant asynchronous timing loop that avoids pessimistic margins and simplifies design. The ADC is implemented in TSMC 28HPM process and achieves high input frequency figure of merit (FoM) of 23fJ/conv-step. Its high frequency Schreier FoM is 165.3dB, which is the highest reported number at this sampling range. The architecture is extended towards implementation of a 12-bit 460MS/s ADC, where two such instances are interleaved to achieve FoM of 30fJ/conv-step and greater than 70dB SFDR.