{"title":"在ATE上计算高性能DAC动态特性的增强程序","authors":"Ming-Hsien Lu","doi":"10.1109/TEST.2013.6651877","DOIUrl":null,"url":null,"abstract":"Due to the current hardware and testing environment limitations, sometimes a perfect coherent condition cannot be satisfied regarding Digital-to-Analog Converter testing. In this paper, the existing algorithms for non-coherent sampling are reviewed and the limitations of each algorithm are analyzed. Then an enhanced procedure is proposed with detail explanation. The experimental results show the new procedure has a higher accuracy and a broader coverage.","PeriodicalId":6379,"journal":{"name":"2013 IEEE International Test Conference (ITC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE\",\"authors\":\"Ming-Hsien Lu\",\"doi\":\"10.1109/TEST.2013.6651877\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Due to the current hardware and testing environment limitations, sometimes a perfect coherent condition cannot be satisfied regarding Digital-to-Analog Converter testing. In this paper, the existing algorithms for non-coherent sampling are reviewed and the limitations of each algorithm are analyzed. Then an enhanced procedure is proposed with detail explanation. The experimental results show the new procedure has a higher accuracy and a broader coverage.\",\"PeriodicalId\":6379,\"journal\":{\"name\":\"2013 IEEE International Test Conference (ITC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2013.6651877\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651877","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE
Due to the current hardware and testing environment limitations, sometimes a perfect coherent condition cannot be satisfied regarding Digital-to-Analog Converter testing. In this paper, the existing algorithms for non-coherent sampling are reviewed and the limitations of each algorithm are analyzed. Then an enhanced procedure is proposed with detail explanation. The experimental results show the new procedure has a higher accuracy and a broader coverage.
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