J. Liu, Yonghai Sun, Siyuan Chen, E. Cheraghi, Jiaqi Wang, Zhemiao Xie, J. Yeow
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A Study of Coulomb Explosion Induced by Freestanding Carbon Nanotube During Field Emission
Low-density patterned Carbon Nanotube (CNT) field emitter is important for applications that require an addressable electron emission source. However, coulomb explosion, that occurs on freestanding CNTs when coulomb repulsion exceeds the limit of van der Waals force, will be induced by low-density patterned CNT field emitters. The coulomb explosion is the main reason cause the short lifetime of low-density patterned CNT field emitters and the direct failure of the CNT field emission (FE) process by inducing a strong arcing between CNT cathode and Indium tin oxide (ITO) anode. Therefore, study the phenomenon of CNT FE induced coulomb explosion and the causes are the keys to increase the lifetime and stability of low-density patterned CNT field emitters.
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