Julen Balzategui, Luka Eciolaza, N. Arana-Arexolaleiba, Jon Altube, J. Aguerre, Iñaki Legarda-Ereño, A. Apraiz
{"title":"基于卷积神经网络的太阳能电池半自动质量检测","authors":"Julen Balzategui, Luka Eciolaza, N. Arana-Arexolaleiba, Jon Altube, J. Aguerre, Iñaki Legarda-Ereño, A. Apraiz","doi":"10.1109/ETFA.2019.8869359","DOIUrl":null,"url":null,"abstract":"Quality control of solar cells is a very important part of the production process. A little crack or joint failure can cause bad performance of the cell in the future, partly because the defective areas can be electrically disconnected from the active zones. Nowadays, one of the techniques to carry out this control is electroluminescence (EL), which allows obtaining high-resolution images of the cells where a visual and non-invasive inspection of defects can be done. This inspection is mostly performed by trained human operators. However, as the eyes become tired after a working day and the subjectivity of the operators, the accuracy with which the defect detection is done may be compromised. In order to solve this problem, a method to assist the operator in the inspection of polycrystalline silicon solar cells surface from EL images based on Convolutional Neural Networks is proposed. The method would classify the cells as defective and non-defective, and suggest those cells that are defective for re-inspection. Also, it would propose a segmentation map of the defects in the cell. To compensate for the lack of image samples in the dataset, each cell image is divided into regions by a sliding window. Then, each region is classified as defective or non-defective. And finally, all classifications related to the cell are resembled obtaining a segmented image of defective areas in the cell.","PeriodicalId":6682,"journal":{"name":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","volume":"24 1","pages":"529-535"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks\",\"authors\":\"Julen Balzategui, Luka Eciolaza, N. Arana-Arexolaleiba, Jon Altube, J. Aguerre, Iñaki Legarda-Ereño, A. Apraiz\",\"doi\":\"10.1109/ETFA.2019.8869359\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quality control of solar cells is a very important part of the production process. A little crack or joint failure can cause bad performance of the cell in the future, partly because the defective areas can be electrically disconnected from the active zones. Nowadays, one of the techniques to carry out this control is electroluminescence (EL), which allows obtaining high-resolution images of the cells where a visual and non-invasive inspection of defects can be done. This inspection is mostly performed by trained human operators. However, as the eyes become tired after a working day and the subjectivity of the operators, the accuracy with which the defect detection is done may be compromised. In order to solve this problem, a method to assist the operator in the inspection of polycrystalline silicon solar cells surface from EL images based on Convolutional Neural Networks is proposed. The method would classify the cells as defective and non-defective, and suggest those cells that are defective for re-inspection. Also, it would propose a segmentation map of the defects in the cell. To compensate for the lack of image samples in the dataset, each cell image is divided into regions by a sliding window. Then, each region is classified as defective or non-defective. And finally, all classifications related to the cell are resembled obtaining a segmented image of defective areas in the cell.\",\"PeriodicalId\":6682,\"journal\":{\"name\":\"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)\",\"volume\":\"24 1\",\"pages\":\"529-535\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETFA.2019.8869359\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETFA.2019.8869359","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks
Quality control of solar cells is a very important part of the production process. A little crack or joint failure can cause bad performance of the cell in the future, partly because the defective areas can be electrically disconnected from the active zones. Nowadays, one of the techniques to carry out this control is electroluminescence (EL), which allows obtaining high-resolution images of the cells where a visual and non-invasive inspection of defects can be done. This inspection is mostly performed by trained human operators. However, as the eyes become tired after a working day and the subjectivity of the operators, the accuracy with which the defect detection is done may be compromised. In order to solve this problem, a method to assist the operator in the inspection of polycrystalline silicon solar cells surface from EL images based on Convolutional Neural Networks is proposed. The method would classify the cells as defective and non-defective, and suggest those cells that are defective for re-inspection. Also, it would propose a segmentation map of the defects in the cell. To compensate for the lack of image samples in the dataset, each cell image is divided into regions by a sliding window. Then, each region is classified as defective or non-defective. And finally, all classifications related to the cell are resembled obtaining a segmented image of defective areas in the cell.