Wang-yun Li, Guanghua Peng, Tianwen Cheng, H. Qin, Jia-Qiang Huang, Dao-Guo Yang
{"title":"低温和低温下体积收缩的微型BGA结构Cu/Sn-3.0Ag-0.5Cu/Cu接头的剪切性能","authors":"Wang-yun Li, Guanghua Peng, Tianwen Cheng, H. Qin, Jia-Qiang Huang, Dao-Guo Yang","doi":"10.1109/ICEPT47577.2019.245195","DOIUrl":null,"url":null,"abstract":"Shear deformation and fracture behavior of microscale BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu joints with a pad diameter 320 μm and a joint height 220 μm and different solder ball diameters 600, 500 and 400 μm (i.e., different solder volumes) were investigated at a temperature from 25 to -120 ºC in this study. Results show that, when the solder ball diameter of the solder joint is 600 μm, the shear strength increases with the descending temperature; while, as the solder ball diameter of the solder joint decreases to 500 and 400 μm, a peak shear strength appeared at -100 and -80 ºC, respectively. Moreover, the fracture behavior of all the joints is temperature dependent. Regardless of the solder ball diameter, the joint fracture position keeps in the solder matrix at a higher temperature, which shifts to the interface between the solder and the interfacial Cu6Sn5 layer at a lower temperature, and the fracture mode shows a ductile-to-brittle transition with the descending temperature. Moreover, the temperature of the ductile-to-brittle transition is joint size dependent, which is lowered as the solder ball diameter decreases.","PeriodicalId":6676,"journal":{"name":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","volume":"79 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Shear performance of microscale BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu joints with shrinking volume at low and cryogenic temperatures\",\"authors\":\"Wang-yun Li, Guanghua Peng, Tianwen Cheng, H. Qin, Jia-Qiang Huang, Dao-Guo Yang\",\"doi\":\"10.1109/ICEPT47577.2019.245195\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shear deformation and fracture behavior of microscale BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu joints with a pad diameter 320 μm and a joint height 220 μm and different solder ball diameters 600, 500 and 400 μm (i.e., different solder volumes) were investigated at a temperature from 25 to -120 ºC in this study. Results show that, when the solder ball diameter of the solder joint is 600 μm, the shear strength increases with the descending temperature; while, as the solder ball diameter of the solder joint decreases to 500 and 400 μm, a peak shear strength appeared at -100 and -80 ºC, respectively. Moreover, the fracture behavior of all the joints is temperature dependent. Regardless of the solder ball diameter, the joint fracture position keeps in the solder matrix at a higher temperature, which shifts to the interface between the solder and the interfacial Cu6Sn5 layer at a lower temperature, and the fracture mode shows a ductile-to-brittle transition with the descending temperature. Moreover, the temperature of the ductile-to-brittle transition is joint size dependent, which is lowered as the solder ball diameter decreases.\",\"PeriodicalId\":6676,\"journal\":{\"name\":\"2019 20th International Conference on Electronic Packaging Technology(ICEPT)\",\"volume\":\"79 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 20th International Conference on Electronic Packaging Technology(ICEPT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEPT47577.2019.245195\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT47577.2019.245195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Shear performance of microscale BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu joints with shrinking volume at low and cryogenic temperatures
Shear deformation and fracture behavior of microscale BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu joints with a pad diameter 320 μm and a joint height 220 μm and different solder ball diameters 600, 500 and 400 μm (i.e., different solder volumes) were investigated at a temperature from 25 to -120 ºC in this study. Results show that, when the solder ball diameter of the solder joint is 600 μm, the shear strength increases with the descending temperature; while, as the solder ball diameter of the solder joint decreases to 500 and 400 μm, a peak shear strength appeared at -100 and -80 ºC, respectively. Moreover, the fracture behavior of all the joints is temperature dependent. Regardless of the solder ball diameter, the joint fracture position keeps in the solder matrix at a higher temperature, which shifts to the interface between the solder and the interfacial Cu6Sn5 layer at a lower temperature, and the fracture mode shows a ductile-to-brittle transition with the descending temperature. Moreover, the temperature of the ductile-to-brittle transition is joint size dependent, which is lowered as the solder ball diameter decreases.