{"title":"数字逻辑电路中路径延迟故障的有效诊断","authors":"P. Pant, A. Chatterjee","doi":"10.1109/ICCAD.1999.810696","DOIUrl":null,"url":null,"abstract":"A novel methodology involving effect-cause analysis has been demonstrated for the diagnosis of path delay faults. We seek to provide an improved understanding of the methods introduced by Y.-C. Hsu and S.K. Gupta (1998), with the goal of devising efficient representations and algorithms for the diagnosis of path delay faults. Results indicate that the diagnostic resolution obtained is very high and includes all possible causes of the observed delay faults.","PeriodicalId":6414,"journal":{"name":"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)","volume":"36 1","pages":"471-475"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Efficient diagnosis of path delay faults in digital logic circuits\",\"authors\":\"P. Pant, A. Chatterjee\",\"doi\":\"10.1109/ICCAD.1999.810696\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel methodology involving effect-cause analysis has been demonstrated for the diagnosis of path delay faults. We seek to provide an improved understanding of the methods introduced by Y.-C. Hsu and S.K. Gupta (1998), with the goal of devising efficient representations and algorithms for the diagnosis of path delay faults. Results indicate that the diagnostic resolution obtained is very high and includes all possible causes of the observed delay faults.\",\"PeriodicalId\":6414,\"journal\":{\"name\":\"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)\",\"volume\":\"36 1\",\"pages\":\"471-475\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1999.810696\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1999.810696","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
摘要
提出了一种基于因果分析的路径延迟故障诊断方法。我们力求对y . c .介绍的方法提供更好的理解。Hsu和S.K. Gupta(1998)，其目标是设计有效的路径延迟故障诊断表示和算法。结果表明，所获得的诊断分辨率非常高，并且包含了观察到的延迟故障的所有可能原因。
Efficient diagnosis of path delay faults in digital logic circuits
A novel methodology involving effect-cause analysis has been demonstrated for the diagnosis of path delay faults. We seek to provide an improved understanding of the methods introduced by Y.-C. Hsu and S.K. Gupta (1998), with the goal of devising efficient representations and algorithms for the diagnosis of path delay faults. Results indicate that the diagnostic resolution obtained is very high and includes all possible causes of the observed delay faults.
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