M. Yabuuchi, Yohei Sawada, T. Sano, Y. Ishii, S. Tanaka, Miki Tanaka, K. Nii
{"title":"6.05 mb /mm2 16纳米FinFET双泵浦1W1R 2端口SRAM,读取访问时间为313 ps","authors":"M. Yabuuchi, Yohei Sawada, T. Sano, Y. Ishii, S. Tanaka, Miki Tanaka, K. Nii","doi":"10.1109/VLSIC.2016.7573460","DOIUrl":null,"url":null,"abstract":"High-density and low-leakage 1W1R 2-port (2P) SRAM is realized by 6T 1-port SRAM bitcell with double pumping internal clock in 16 nm FinFET technology. Proposed clock generator with address latch circuit enables robust timing design without sever setup/hold margin. We designed a 256 kb 1W1R 2P SRAM macro which achieves the highest density of 6.05 Mb/mm2. Measured data shows that a 313 ps of read-access-time is observed at 0.8 V. Standby leakage power in resume standby (RS) mode is reduced by 79% compared to the conventional dual-port SRAM without RS.","PeriodicalId":6512,"journal":{"name":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","volume":"33 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A 6.05-Mb/mm2 16-nm FinFET double pumping 1W1R 2-port SRAM with 313 ps read access time\",\"authors\":\"M. Yabuuchi, Yohei Sawada, T. Sano, Y. Ishii, S. Tanaka, Miki Tanaka, K. Nii\",\"doi\":\"10.1109/VLSIC.2016.7573460\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High-density and low-leakage 1W1R 2-port (2P) SRAM is realized by 6T 1-port SRAM bitcell with double pumping internal clock in 16 nm FinFET technology. Proposed clock generator with address latch circuit enables robust timing design without sever setup/hold margin. We designed a 256 kb 1W1R 2P SRAM macro which achieves the highest density of 6.05 Mb/mm2. Measured data shows that a 313 ps of read-access-time is observed at 0.8 V. Standby leakage power in resume standby (RS) mode is reduced by 79% compared to the conventional dual-port SRAM without RS.\",\"PeriodicalId\":6512,\"journal\":{\"name\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"volume\":\"33 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2016.7573460\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2016.7573460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 6.05-Mb/mm2 16-nm FinFET double pumping 1W1R 2-port SRAM with 313 ps read access time
High-density and low-leakage 1W1R 2-port (2P) SRAM is realized by 6T 1-port SRAM bitcell with double pumping internal clock in 16 nm FinFET technology. Proposed clock generator with address latch circuit enables robust timing design without sever setup/hold margin. We designed a 256 kb 1W1R 2P SRAM macro which achieves the highest density of 6.05 Mb/mm2. Measured data shows that a 313 ps of read-access-time is observed at 0.8 V. Standby leakage power in resume standby (RS) mode is reduced by 79% compared to the conventional dual-port SRAM without RS.