{"title":"PCB翘曲的讨论与失效分析","authors":"Ying Yang","doi":"10.1109/ICEPT47577.2019.245186","DOIUrl":null,"url":null,"abstract":"In current trend of miniaturization and integration of electronic devices, surface mount technology process puts higher demands on the demands on the flatness of printed circuit boards. It is a very important topic to minimize the warpage of PCB by optimizing process technology. This article discusses the main causes of PCB warpage and presents a failure analysis case for PCB warpage.","PeriodicalId":6676,"journal":{"name":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","volume":"16 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Discussion and failure analysis of PCB warpage\",\"authors\":\"Ying Yang\",\"doi\":\"10.1109/ICEPT47577.2019.245186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In current trend of miniaturization and integration of electronic devices, surface mount technology process puts higher demands on the demands on the flatness of printed circuit boards. It is a very important topic to minimize the warpage of PCB by optimizing process technology. This article discusses the main causes of PCB warpage and presents a failure analysis case for PCB warpage.\",\"PeriodicalId\":6676,\"journal\":{\"name\":\"2019 20th International Conference on Electronic Packaging Technology(ICEPT)\",\"volume\":\"16 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 20th International Conference on Electronic Packaging Technology(ICEPT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEPT47577.2019.245186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT47577.2019.245186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

在当前电子器件小型化、集成化的趋势下,表面贴装工艺对印刷电路板的平面度提出了更高的要求。通过优化工艺工艺,使PCB板翘曲量最小化是一个非常重要的课题。本文讨论了PCB板翘曲的主要原因,并给出了一个PCB板翘曲的失效分析案例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Discussion and failure analysis of PCB warpage
In current trend of miniaturization and integration of electronic devices, surface mount technology process puts higher demands on the demands on the flatness of printed circuit boards. It is a very important topic to minimize the warpage of PCB by optimizing process technology. This article discusses the main causes of PCB warpage and presents a failure analysis case for PCB warpage.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Laser-assisted Glass Frit Bonding Combined With Blue Light-shielding Dynamic resistance monitoring of aging process of pressureless sintered nano-silver joints Warpage simulation method development considering moiré inhomogeneous temperature field Size effects on segregated growth kinetics of interfacial IMC between Sn solder and Cu substrate Ultrasound-assisted soldering process performance of Sn-Ag-Ti(Ce, Ga) active solders on thin film ZnO substrate
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1