{"title":"使用电压域周期校准环路的pvt鲁棒- 59 dbc参考杂散和450-fsRMS抖动注入锁定时钟乘法器","authors":"Yongsun Lee, Heein Yoon, Mina Kim, Jaehyouk Choi","doi":"10.1109/VLSIC.2016.7573550","DOIUrl":null,"url":null,"abstract":"This paper presents a low-reference-spur and low-jitter injection-locked clock multiplier (ILCM). To secure these performances over PVT-variations, we propose the use of a voltage-domain period-calibrating loop (VDPCL) in the ILCM that monitors the intrinsic period of the VCO and stores this information as the charges in a capacitor. By evaluating the voltage of the capacitor, it is possible to correct the free-running frequency of the VCO. By iteratively accumulating charges, the precision of the calibration can be increased. The measured reference spur and RMS jitter were -59 dBc and 450 fs, respectively, and their degradations over the PVT were less than 1.5 dB and 50 fs, respectively.","PeriodicalId":6512,"journal":{"name":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","volume":"2 38 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"A PVT-robust −59-dBc reference spur and 450-fsRMS jitter injection-locked clock multiplier using a voltage-domain period-calibrating loop\",\"authors\":\"Yongsun Lee, Heein Yoon, Mina Kim, Jaehyouk Choi\",\"doi\":\"10.1109/VLSIC.2016.7573550\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a low-reference-spur and low-jitter injection-locked clock multiplier (ILCM). To secure these performances over PVT-variations, we propose the use of a voltage-domain period-calibrating loop (VDPCL) in the ILCM that monitors the intrinsic period of the VCO and stores this information as the charges in a capacitor. By evaluating the voltage of the capacitor, it is possible to correct the free-running frequency of the VCO. By iteratively accumulating charges, the precision of the calibration can be increased. The measured reference spur and RMS jitter were -59 dBc and 450 fs, respectively, and their degradations over the PVT were less than 1.5 dB and 50 fs, respectively.\",\"PeriodicalId\":6512,\"journal\":{\"name\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"volume\":\"2 38 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2016.7573550\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2016.7573550","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A PVT-robust −59-dBc reference spur and 450-fsRMS jitter injection-locked clock multiplier using a voltage-domain period-calibrating loop
This paper presents a low-reference-spur and low-jitter injection-locked clock multiplier (ILCM). To secure these performances over PVT-variations, we propose the use of a voltage-domain period-calibrating loop (VDPCL) in the ILCM that monitors the intrinsic period of the VCO and stores this information as the charges in a capacitor. By evaluating the voltage of the capacitor, it is possible to correct the free-running frequency of the VCO. By iteratively accumulating charges, the precision of the calibration can be increased. The measured reference spur and RMS jitter were -59 dBc and 450 fs, respectively, and their degradations over the PVT were less than 1.5 dB and 50 fs, respectively.