Y. Oike, Kentaro Akiyama, Luong D. Hung, Wataru Niitsuma, A. Kato, Mamoru Sato, Yuri Kato, Wataru Nakamura, Hiroshi Shiroshita, Y. Sakano, Y. Kitano, Takuya Nakamura, T. Toyama, H. Iwamoto, T. Ezaki
{"title":"具有增益自适应列式adc和2对1堆叠器件结构的8.3 m像素480fps全局快门CMOS图像传感器","authors":"Y. Oike, Kentaro Akiyama, Luong D. Hung, Wataru Niitsuma, A. Kato, Mamoru Sato, Yuri Kato, Wataru Nakamura, Hiroshi Shiroshita, Y. Sakano, Y. Kitano, Takuya Nakamura, T. Toyama, H. Iwamoto, T. Ezaki","doi":"10.1109/VLSIC.2016.7573543","DOIUrl":null,"url":null,"abstract":"A 4K2K 480 fps global-shutter CMOS image sensor has been developed with super 35 mm format. This sensor employs newly developed gain-adaptive column ADCs to attain a dark random noise of 140 μVrms for the full-scale readout of 923 mV. An on-chip online correction of the error between two switchable gains maintains the nonlinearity of output image within 0.18 %. The 16-channel output interfaces with 4.752 Gbps/ch are implemented in 2 diced logic chips stacked on a sensor chip with 38K micro bumps.","PeriodicalId":6512,"journal":{"name":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","volume":"148 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":"{\"title\":\"An 8.3M-pixel 480fps global-shutter CMOS image sensor with gain-adaptive column ADCs and 2-on-1 stacked device structure\",\"authors\":\"Y. Oike, Kentaro Akiyama, Luong D. Hung, Wataru Niitsuma, A. Kato, Mamoru Sato, Yuri Kato, Wataru Nakamura, Hiroshi Shiroshita, Y. Sakano, Y. Kitano, Takuya Nakamura, T. Toyama, H. Iwamoto, T. Ezaki\",\"doi\":\"10.1109/VLSIC.2016.7573543\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 4K2K 480 fps global-shutter CMOS image sensor has been developed with super 35 mm format. This sensor employs newly developed gain-adaptive column ADCs to attain a dark random noise of 140 μVrms for the full-scale readout of 923 mV. An on-chip online correction of the error between two switchable gains maintains the nonlinearity of output image within 0.18 %. The 16-channel output interfaces with 4.752 Gbps/ch are implemented in 2 diced logic chips stacked on a sensor chip with 38K micro bumps.\",\"PeriodicalId\":6512,\"journal\":{\"name\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"volume\":\"148 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"40\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2016.7573543\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2016.7573543","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An 8.3M-pixel 480fps global-shutter CMOS image sensor with gain-adaptive column ADCs and 2-on-1 stacked device structure
A 4K2K 480 fps global-shutter CMOS image sensor has been developed with super 35 mm format. This sensor employs newly developed gain-adaptive column ADCs to attain a dark random noise of 140 μVrms for the full-scale readout of 923 mV. An on-chip online correction of the error between two switchable gains maintains the nonlinearity of output image within 0.18 %. The 16-channel output interfaces with 4.752 Gbps/ch are implemented in 2 diced logic chips stacked on a sensor chip with 38K micro bumps.