针对线性射频应用设计的金属-绝缘体-二维材料场效应管的器件到电路建模方法

A. Toral-Lopez, F. Pasadas, E. G. Marín, A. Medina-Rull, F. Ruiz, D. Jiménez, A. Godoy
{"title":"针对线性射频应用设计的金属-绝缘体-二维材料场效应管的器件到电路建模方法","authors":"A. Toral-Lopez, F. Pasadas, E. G. Marín, A. Medina-Rull, F. Ruiz, D. Jiménez, A. Godoy","doi":"10.1109/SISPAD.2019.8870562","DOIUrl":null,"url":null,"abstract":"We present a physics-based device-to-circuit modeling approach to metal – insulator – 2D material based field-effect transistors (2DFETs). Starting from numerical simulations based on the self-consistent solution of the 2D Poisson and 1D Drift-Diffusion equations, we obtain the electrostatics and current-voltage characteristics of such devices. Then, assuming small-signal operation, a charge-based equivalent circuit is fed with the small-signal parameters computed from the numerical results and then it is implemented in a standard circuit simulator. This framework enables the design and assessment of linear radio-frequency applications based on novel and emergent 2DFETs. The approach has been applied to an experimental MoS2 transistor by benchmarking the transfer characteristics and then predicting the expected performance of such device as a common-source power amplifier, for instance a power gain of 8.6 dB at 2.45 GHz.","PeriodicalId":6755,"journal":{"name":"2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)","volume":"27 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Device-to-circuit modeling approach to Metal – Insulator – 2D material FETs targeting the design of linear RF applications\",\"authors\":\"A. Toral-Lopez, F. Pasadas, E. G. Marín, A. Medina-Rull, F. Ruiz, D. Jiménez, A. Godoy\",\"doi\":\"10.1109/SISPAD.2019.8870562\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a physics-based device-to-circuit modeling approach to metal – insulator – 2D material based field-effect transistors (2DFETs). Starting from numerical simulations based on the self-consistent solution of the 2D Poisson and 1D Drift-Diffusion equations, we obtain the electrostatics and current-voltage characteristics of such devices. Then, assuming small-signal operation, a charge-based equivalent circuit is fed with the small-signal parameters computed from the numerical results and then it is implemented in a standard circuit simulator. This framework enables the design and assessment of linear radio-frequency applications based on novel and emergent 2DFETs. The approach has been applied to an experimental MoS2 transistor by benchmarking the transfer characteristics and then predicting the expected performance of such device as a common-source power amplifier, for instance a power gain of 8.6 dB at 2.45 GHz.\",\"PeriodicalId\":6755,\"journal\":{\"name\":\"2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)\",\"volume\":\"27 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SISPAD.2019.8870562\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2019.8870562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

我们提出了一种基于物理的器件到电路建模方法,用于金属绝缘体二维材料场效应晶体管(2dfet)。基于二维泊松方程和一维漂移-扩散方程的自一致解,从数值模拟出发,得到了该类器件的静电特性和电流-电压特性。然后,假设小信号工作,将数值计算得到的小信号参数馈送到基于电荷的等效电路中,然后在标准电路模拟器中实现。该框架能够设计和评估基于新型和新兴2dfet的线性射频应用。该方法已应用于实验MoS2晶体管,通过对传输特性进行基准测试,然后预测该器件作为共源功率放大器的预期性能,例如在2.45 GHz时的功率增益为8.6 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Device-to-circuit modeling approach to Metal – Insulator – 2D material FETs targeting the design of linear RF applications
We present a physics-based device-to-circuit modeling approach to metal – insulator – 2D material based field-effect transistors (2DFETs). Starting from numerical simulations based on the self-consistent solution of the 2D Poisson and 1D Drift-Diffusion equations, we obtain the electrostatics and current-voltage characteristics of such devices. Then, assuming small-signal operation, a charge-based equivalent circuit is fed with the small-signal parameters computed from the numerical results and then it is implemented in a standard circuit simulator. This framework enables the design and assessment of linear radio-frequency applications based on novel and emergent 2DFETs. The approach has been applied to an experimental MoS2 transistor by benchmarking the transfer characteristics and then predicting the expected performance of such device as a common-source power amplifier, for instance a power gain of 8.6 dB at 2.45 GHz.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Effect of Stacking Faults on the Thermoelectric Figure of Merit of Si Nanowires Effect of Trap on Carrier Transport in InAs FET with Al2 O3 Oxide: DFT-based NEGF simulations Defect creation and Diffusion under electric fields from first-principles: the prototypical case of silicon dioxide Quantum Transport Simulations of the Zero Temperature Coefficient in Gate-all-around Nanowire pFETs Electronic and structural properties of interstitial titanium in crystalline silicon from first-principles simulations
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1