采用三阶噪声整形时间-数字转换器的28.5-33.5GHz分数n锁相环,分辨率为176fs

M. B. Dayanik, Nicholas Collins, M. Flynn
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引用次数: 10

摘要

本文提出了一种基于新型三阶噪声整形连续时间δ σ时间-数字转换器(TDC)的65nm CMOS 28.5 ghz ~ 33.5 ghz多数字分数n锁相环。据作者所知,该TDC在1MHz带宽下的测量时间分辨率为176fs,是所有已发布的TDC中测量时间分辨率最高的。锁相环的归一化相位噪声为-213dBc/Hz2(在100kHz偏移时),FoMJitter为-230dB(从10khz到1mhz)。归一化相位噪声和FoMJitter都比任何已发布的数字整数或数字小数n高频(>20GHz)锁相环好5dB。
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A 28.5–33.5GHz fractional-N PLL using a 3rd order noise shaping time-to-digital converter with 176fs resolution
This paper presents a 65nm CMOS 28.5GHz-to-33.5GHz mostly digital fractional-N PLL based on a new 3rd order noise-shaping continuous time delta sigma time-to-digital converter (TDC). With a measured time resolution of 176fs, the TDC has the finest measured time resolution in a 1MHz bandwidth of any published TDC, to the best knowledge of the authors. The PLL achieves a normalized phase noise of -213dBc/Hz2 (at a 100kHz offset) and FoMJitter of -230dB (from 10kHz-to-1MHz). Both the normalized phase noise and FoMJitter are 5dB better than for any published digital integer or digital fractional-N high frequency (>20GHz) PLL.
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