Ronald G. Filippi, Ping-Chuan Wang, A. Brendler, Paul S. McLaughlin, J. Poulin, B. Redder, James R. Lloyd, James J. Demarest
{"title":"最佳论文奖:阈值失效时间和双峰行为对铜互连电迁移寿命的影响","authors":"Ronald G. Filippi, Ping-Chuan Wang, A. Brendler, Paul S. McLaughlin, J. Poulin, B. Redder, James R. Lloyd, James J. Demarest","doi":"10.1109/IRPS.2011.5784438","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6387,"journal":{"name":"2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"Best Paper Award: The effect of a threshold failure time and bimodal behavior on the electromigration lifetime of copper interconnects\",\"authors\":\"Ronald G. Filippi, Ping-Chuan Wang, A. Brendler, Paul S. McLaughlin, J. Poulin, B. Redder, James R. Lloyd, James J. Demarest\",\"doi\":\"10.1109/IRPS.2011.5784438\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":6387,\"journal\":{\"name\":\"2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2011.5784438\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2011.5784438","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}