M. Boubaaya, H. Tahi, Cherifa Tahanout, B. Djezzar, Abdelmadjid Benabdelmomene, A. Chenouf, D. Doumaz, Abdelhak Feraht Hemida
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引用次数: 0
Abstract
Instead, the classical consideration that the geometric component in charge pumping method (CP) is parasitic component, in this work we demonstrate that this component can be used to estimate the negative bias temperature (NBTI) induced mobility degradation using the charge pumping based method such as on- the-fly interface trap (OTFIT).
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